Epitaxní rekrystalizace rozhraní Ni/MgO(001)

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F04%3A00105606" target="_blank" >RIV/61389005:_____/04:00105606 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Epitaxial re-crystallization of the Ni/MgO(001) interfaces

Popis výsledku v původním jazyce

Metal/ceramic interfaces have become important for advanced technologies in a variety of ways. To effectively tailor their properties, it is important to understand the mechanisms which govern the structural formation of the systems during deposition orpost-deposition processing. Here, results on epitaxial re-crystallization of the Ni/MgO(0 0 1) interfaces are reported: (i) as deposited, the Ni films were grown on the MgO(0 0 1) substrates epitaxially, (ii) consecutive thermal annealing incited the process of re-crystallization, which led to the substantial improvement of their crystalline quality. The restructuring proceeded in a non-linear way, indicating that an intricate structural evolution was triggered in the system. Based on the results of theX-ray diffraction and Rutherford backscattering/channeling, the effect of thermal processing on the structural transformation of the Ni/MgO(0 0 1) interface is discussed in this paper.

Název v anglickém jazyce

Epitaxial re-crystallization of the Ni/MgO(001) interfaces

Popis výsledku anglicky

Metal/ceramic interfaces have become important for advanced technologies in a variety of ways. To effectively tailor their properties, it is important to understand the mechanisms which govern the structural formation of the systems during deposition orpost-deposition processing. Here, results on epitaxial re-crystallization of the Ni/MgO(0 0 1) interfaces are reported: (i) as deposited, the Ni films were grown on the MgO(0 0 1) substrates epitaxially, (ii) consecutive thermal annealing incited the process of re-crystallization, which led to the substantial improvement of their crystalline quality. The restructuring proceeded in a non-linear way, indicating that an intricate structural evolution was triggered in the system. Based on the results of theX-ray diffraction and Rutherford backscattering/channeling, the effect of thermal processing on the structural transformation of the Ni/MgO(0 0 1) interface is discussed in this paper.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2004

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH

ISSN

0168-583X

e-ISSN

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Svazek periodika

219

Číslo periodika v rámci svazku

20

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

4

Strana od-do

867-870

Kód UT WoS článku

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EID výsledku v databázi Scopus

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