Charakteristiky tenkých vrstev polystyrenu a dopovaného polymethylmet krystalu

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F05%3A00307936" target="_blank" >RIV/61389005:_____/05:00307936 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

Characterization of polystyrene and doped polymethylmethacrylate thin layers

Popis výsledku v původním jazyce

About 1 mu m thick films of polystyrene (PS) and polymethylmethacrylate (PMMA) were prepared from solutions using spin-coating method. The PMMA films were doped with diphenylsulfoxide (DS) up to 45 wt%. Glass transition temperature (T-g) of doped PMMA films was determined by DSC technique and relative permittivity (epsilon) as a function of the sample temperature was determined from capacitance measurement. The dependence of polarization (P) on electric field (E) and the temperature was measured using astandard Sawyer-Tower circuit. Spectral dependence of film refractive index was measured using a refractometer. The glass transition temperature T-g of PMMA/DS composite was found to be decreasing function of the DS concentration. Relative permittivityepsilon of unpolar PS is lower than that of polar PMMA. The PS permittivity does not depend on the sample temperature. For PMMA the permittivity is increasing function of both, DS dopant concentration and sample temperature.

Název v anglickém jazyce

Characterization of polystyrene and doped polymethylmethacrylate thin layers

Popis výsledku anglicky

About 1 mu m thick films of polystyrene (PS) and polymethylmethacrylate (PMMA) were prepared from solutions using spin-coating method. The PMMA films were doped with diphenylsulfoxide (DS) up to 45 wt%. Glass transition temperature (T-g) of doped PMMA films was determined by DSC technique and relative permittivity (epsilon) as a function of the sample temperature was determined from capacitance measurement. The dependence of polarization (P) on electric field (E) and the temperature was measured using astandard Sawyer-Tower circuit. Spectral dependence of film refractive index was measured using a refractometer. The glass transition temperature T-g of PMMA/DS composite was found to be decreasing function of the DS concentration. Relative permittivityepsilon of unpolar PS is lower than that of polar PMMA. The PS permittivity does not depend on the sample temperature. For PMMA the permittivity is increasing function of both, DS dopant concentration and sample temperature.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

—

Projekt

<a href="/cs/project/GA106%2F03%2F0514" target="_blank" >GA106/03/0514: Modifikované polymery pro tkáňové inženýrství</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2005

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Materials Science-Materials in Electronics

ISSN

0957-4522

e-ISSN

—

Svazek periodika

16

Číslo periodika v rámci svazku

11-12

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

5

Strana od-do

761-765

Kód UT WoS článku

—

EID výsledku v databázi Scopus

—