Charakterizace polymerů PEEK, PET a PI implantovaných Ni+ ionty

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F09%3A00324684" target="_blank" >RIV/61389005:_____/09:00324684 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/60461373:22310/09:00021552 RIV/44555601:13440/09:00004840

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Characterisation of Ni+ implanted PEEK, PET and PI

Popis výsledku v původním jazyce

Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni+ ions at room temperature at fluences ranging from 10^16 to 1.5x10^17 ions cm-2. The depth profiles of the implanted Ni atoms were determined bythe RBS technique and compared with those predicted by the SRIM and TRIDYN codes. Hydrogen depletion as a function of the ion fluence was determined by the ERDA technique, and the compositional and structural changes of the polymers were characterised by the UV?vis and XPS methods. The implanted profiles differed significantly from those predicted by the SRIM code while the lower fluences were satisfactorily described by the TRIDYN simulation. A significant hydrogen release from the polymer surface layer was observed along with significant changes in the surface layer composition. The UV?vis results indicated an increase of the concentration of double bonds, XPS showed increasing concentration Ni0+ with the increasing ion fluence.

Název v anglickém jazyce

Characterisation of Ni+ implanted PEEK, PET and PI

Popis výsledku anglicky

Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni+ ions at room temperature at fluences ranging from 10^16 to 1.5x10^17 ions cm-2. The depth profiles of the implanted Ni atoms were determined bythe RBS technique and compared with those predicted by the SRIM and TRIDYN codes. Hydrogen depletion as a function of the ion fluence was determined by the ERDA technique, and the compositional and structural changes of the polymers were characterised by the UV?vis and XPS methods. The implanted profiles differed significantly from those predicted by the SRIM code while the lower fluences were satisfactorily described by the TRIDYN simulation. A significant hydrogen release from the polymer surface layer was observed along with significant changes in the surface layer composition. The UV?vis results indicated an increase of the concentration of double bonds, XPS showed increasing concentration Ni0+ with the increasing ion fluence.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2009

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nuclear Instruments & Methods in Physics Research Section B

ISSN

0168-583X

e-ISSN

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Svazek periodika

267

Číslo periodika v rámci svazku

-

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

4

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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