Modification of MoS2 structure by means of high energy ions in connection to electrical properties and light element surface adsorption

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F19%3A00517281" target="_blank" >RIV/61389005:_____/19:00517281 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/60461373:22310/19:43918152 RIV/44555601:13440/19:43894723

Výsledek na webu

<a href="https://doi.org/10.1016/j.surfin.2019.100357" target="_blank" >https://doi.org/10.1016/j.surfin.2019.100357</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.surfin.2019.100357" target="_blank" >10.1016/j.surfin.2019.100357</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Modification of MoS2 structure by means of high energy ions in connection to electrical properties and light element surface adsorption

Popis výsledku v původním jazyce

MoS2 samples were intentionally modified using high energy ions (He, Si and Au) at the ion energy of 1.8 MeV and the ion fluence ranging between 1 x 10(13) and 1 x 10(15) cm(-2) to tailor intentionally the surface electric and structural properties of MoS2. Light and medium energetic ions can be effectively used for ion beam micro-structuring in various materials e.g. graphene and MoS2, thus the material modification study under high energy ions leading to electronic stopping of ions is mandatory for this application. Rutherford Back-Scattering spectrometry (RBS) and Elastic Recoil Detection Analysis (ERDA) were used for elemental analysis, including hydrogen surface depth profiling, of the modified MoS2 samples. Scanning Electron Microscopy (SEM) with Energy Dispersive X-ray (EDX) and X-ray Photoelectron Spectroscopy (XPS) analysis were used to investigate the surface morphology influenced by the irradiation as well as to follow the surface layer elemental composition. Raman spectroscopy was employed to study the structural modification and disorder accumulation caused by energetic ion irradiation. Simultaneously, two-point method was applied for electrical properties measurement. Surface morphology modification enhances with the increasing ion fluence for all ion species. Surface deterioration and sulphur depletion in MoS2 was observed not only for heaviest ion irradiation (Au) as was expected, but also for light ions (He). Interior structure damage was observed to be the most prominent in case of Au irradiation as it was concluded from the most significant A(1g) and E-2g(1) phonon shift and broadening with increasing Au ion fluence in Raman spectra. On the other hand, the interior structure deterioration was only negligible in case of He irradiated samples. Surface hydrogen content was observed to be a function of ion implantation fluence and ion mass. Electrical resistivity was increased as a consequence of ion irradiation for heaviest ions. After Si and Au irradiation, the resistivity increased for the lowest ion fluence and subsequently decreases with increasing ion fluence being higher for the irradiated samples compared to the pristine one.

Název v anglickém jazyce

Modification of MoS2 structure by means of high energy ions in connection to electrical properties and light element surface adsorption

Popis výsledku anglicky

MoS2 samples were intentionally modified using high energy ions (He, Si and Au) at the ion energy of 1.8 MeV and the ion fluence ranging between 1 x 10(13) and 1 x 10(15) cm(-2) to tailor intentionally the surface electric and structural properties of MoS2. Light and medium energetic ions can be effectively used for ion beam micro-structuring in various materials e.g. graphene and MoS2, thus the material modification study under high energy ions leading to electronic stopping of ions is mandatory for this application. Rutherford Back-Scattering spectrometry (RBS) and Elastic Recoil Detection Analysis (ERDA) were used for elemental analysis, including hydrogen surface depth profiling, of the modified MoS2 samples. Scanning Electron Microscopy (SEM) with Energy Dispersive X-ray (EDX) and X-ray Photoelectron Spectroscopy (XPS) analysis were used to investigate the surface morphology influenced by the irradiation as well as to follow the surface layer elemental composition. Raman spectroscopy was employed to study the structural modification and disorder accumulation caused by energetic ion irradiation. Simultaneously, two-point method was applied for electrical properties measurement. Surface morphology modification enhances with the increasing ion fluence for all ion species. Surface deterioration and sulphur depletion in MoS2 was observed not only for heaviest ion irradiation (Au) as was expected, but also for light ions (He). Interior structure damage was observed to be the most prominent in case of Au irradiation as it was concluded from the most significant A(1g) and E-2g(1) phonon shift and broadening with increasing Au ion fluence in Raman spectra. On the other hand, the interior structure deterioration was only negligible in case of He irradiated samples. Surface hydrogen content was observed to be a function of ion implantation fluence and ion mass. Electrical resistivity was increased as a consequence of ion irradiation for heaviest ions. After Si and Au irradiation, the resistivity increased for the lowest ion fluence and subsequently decreases with increasing ion fluence being higher for the irradiated samples compared to the pristine one.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10301 - Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2019

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

SURFACES AND INTERFACES

ISSN

2468-0230

e-ISSN

—

Svazek periodika

17

Číslo periodika v rámci svazku

12

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

10

Strana od-do

100357

Kód UT WoS článku

000493921900020

EID výsledku v databázi Scopus

2-s2.0-85069569260