Graphene oxide as a radiation sensitive material for XPS dosimetry

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F20%3A00523927" target="_blank" >RIV/61389005:_____/20:00523927 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1016/j.vacuum.2020.109175" target="_blank" >https://doi.org/10.1016/j.vacuum.2020.109175</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.vacuum.2020.109175" target="_blank" >10.1016/j.vacuum.2020.109175</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Graphene oxide as a radiation sensitive material for XPS dosimetry

Popis výsledku v původním jazyce

The suitability of graphene oxide (GO) foils as radiation sensitive materials for soft X-ray irradiation is investigated by means of X-ray photoelectron spectroscopy (XPS). In particular GO micrometric foils have been irradiated by soft X-rays at a 1486.6 eV energy at high flux (>10(12) photons/cm(2)s) in ultra-high vacuum. The XPS analysis of the carbon-carbon (CC) and the carbon-oxygen links (CO) characterizes the composition of the first layers of the GO foils. The CC/CO ratio of the high-resolution C1s XPS spectrum is used as dosimetric index. The incident X-ray photons, proportionally to their fluence, partially reduce GO foils decreasing the amount of oxygen groups chemically bonded to carbon network. This decrease causes an increase on the CC/CO ratio that is correlated to the irradiation time, i.e. to the dose absorbed by the GO foil, showing a linear increment with the dose. Our preliminary investigations indicate that GO can be employed to realize a thin foil dosimeter giving a linear response to the absorbed dose in the (275.76 kGy divided by 8.02 MGy) range. The absorbed dose can be also evaluated by measuring the C/O ratio from the C1s and O1s XPS spectra analysis or with different techniques, as discussed in the paper.

Název v anglickém jazyce

Graphene oxide as a radiation sensitive material for XPS dosimetry

Popis výsledku anglicky

The suitability of graphene oxide (GO) foils as radiation sensitive materials for soft X-ray irradiation is investigated by means of X-ray photoelectron spectroscopy (XPS). In particular GO micrometric foils have been irradiated by soft X-rays at a 1486.6 eV energy at high flux (>10(12) photons/cm(2)s) in ultra-high vacuum. The XPS analysis of the carbon-carbon (CC) and the carbon-oxygen links (CO) characterizes the composition of the first layers of the GO foils. The CC/CO ratio of the high-resolution C1s XPS spectrum is used as dosimetric index. The incident X-ray photons, proportionally to their fluence, partially reduce GO foils decreasing the amount of oxygen groups chemically bonded to carbon network. This decrease causes an increase on the CC/CO ratio that is correlated to the irradiation time, i.e. to the dose absorbed by the GO foil, showing a linear increment with the dose. Our preliminary investigations indicate that GO can be employed to realize a thin foil dosimeter giving a linear response to the absorbed dose in the (275.76 kGy divided by 8.02 MGy) range. The absorbed dose can be also evaluated by measuring the C/O ratio from the C1s and O1s XPS spectra analysis or with different techniques, as discussed in the paper.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20501 - Materials engineering

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Vacuum

ISSN

0042-207X

e-ISSN

—

Svazek periodika

173

Číslo periodika v rámci svazku

3

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

8

Strana od-do

109175

Kód UT WoS článku

000518672200050

EID výsledku v databázi Scopus

2-s2.0-85077657199