Wide-range tracking and LET-spectra of energetic light and heavy charged particles

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F21%3A00539472" target="_blank" >RIV/61389005:_____/21:00539472 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1016/j.nima.2020.164901" target="_blank" >https://doi.org/10.1016/j.nima.2020.164901</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.nima.2020.164901" target="_blank" >10.1016/j.nima.2020.164901</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Wide-range tracking and LET-spectra of energetic light and heavy charged particles

Popis výsledku v původním jazyce

We developed a highly-selective technique to measure the energy loss and linear-energy-transfer (LET) spectra of energetic charged particles in high-resolution and over a large collection of particle-event types. Precise and wide-range spectral and tracking measurements were performed with a single semiconductor pixel detector. The quantum-counting sensitivity, high-granularity and per-pixel spectrometric response of the Timepix ASIC chip enable the detailed spectral-tracking registration of single charged particles across the detector semiconductor sensor. Both the deposited energy along the particle trajectory (energy loss) and the path length of the particle track across the semiconductor sensor are precisely measured for each particle. This allows for the determination of the particle LET in silicon in high accuracy and over a wide-range of energies, particle types and directions. The tracking and energy loss response together with the resolving power at the particle-event level make it possible to selectively provide LET distributions of the light and heavy charged particle components in mixed-radiation and omnidirectional fields. This technique applies to energetic (E > 10 MeV/u) charged particles generating tracks greater than the pixel size and incident at nonperpendicular direction (>20 degrees) to the sensor plane. The technique applies also to electrons of energy above few MeV as well as highly energetic and minimum-ionizing-particles (MIPs). We make use of existing and in part newly collected data at well-defined radiation fields with proton and light ion beam accelerators. Flexible measurements, ease of deployment and online response are possible by the use of compact readout electronics such as the miniaturized radiation camera MiniPix (size < 8 cm, weight < 50 g) operable by any PC. Results are given for protons and light ions (He, C) of selected energies above 10 MeV/u and directions (2 pi FoV). We include also electrons (20 MeV). Selective and detailed LET spectra are produced over a wide range (10(-1) to 102 keV/mu m) in silicon.

Název v anglickém jazyce

Wide-range tracking and LET-spectra of energetic light and heavy charged particles

Popis výsledku anglicky

We developed a highly-selective technique to measure the energy loss and linear-energy-transfer (LET) spectra of energetic charged particles in high-resolution and over a large collection of particle-event types. Precise and wide-range spectral and tracking measurements were performed with a single semiconductor pixel detector. The quantum-counting sensitivity, high-granularity and per-pixel spectrometric response of the Timepix ASIC chip enable the detailed spectral-tracking registration of single charged particles across the detector semiconductor sensor. Both the deposited energy along the particle trajectory (energy loss) and the path length of the particle track across the semiconductor sensor are precisely measured for each particle. This allows for the determination of the particle LET in silicon in high accuracy and over a wide-range of energies, particle types and directions. The tracking and energy loss response together with the resolving power at the particle-event level make it possible to selectively provide LET distributions of the light and heavy charged particle components in mixed-radiation and omnidirectional fields. This technique applies to energetic (E > 10 MeV/u) charged particles generating tracks greater than the pixel size and incident at nonperpendicular direction (>20 degrees) to the sensor plane. The technique applies also to electrons of energy above few MeV as well as highly energetic and minimum-ionizing-particles (MIPs). We make use of existing and in part newly collected data at well-defined radiation fields with proton and light ion beam accelerators. Flexible measurements, ease of deployment and online response are possible by the use of compact readout electronics such as the miniaturized radiation camera MiniPix (size < 8 cm, weight < 50 g) operable by any PC. Results are given for protons and light ions (He, C) of selected energies above 10 MeV/u and directions (2 pi FoV). We include also electrons (20 MeV). Selective and detailed LET spectra are produced over a wide range (10(-1) to 102 keV/mu m) in silicon.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20305 - Nuclear related engineering; (nuclear physics to be 1.3);

Projekt

<a href="/cs/project/LM2015056" target="_blank" >LM2015056: Centrum urychlovačů a jaderných analytických metod</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2021

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nuclear Instruments & Methods in Physics Research Section A

ISSN

0168-9002

e-ISSN

1872-9576

Svazek periodika

988

Číslo periodika v rámci svazku

FEB

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

12

Strana od-do

164901

Kód UT WoS článku

000604627500016

EID výsledku v databázi Scopus

2-s2.0-85097341986