Effect of Europium Addition on the Microstructure and Dielectric Properties of CCTO Ceramic Prepared Using Conventional and Microwave Sintering

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389021%3A_____%2F23%3A00583096" target="_blank" >RIV/61389021:_____/23:00583096 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.mdpi.com/1420-3049/28/4/1649" target="_blank" >https://www.mdpi.com/1420-3049/28/4/1649</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.3390/molecules28041649" target="_blank" >10.3390/molecules28041649</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Effect of Europium Addition on the Microstructure and Dielectric Properties of CCTO Ceramic Prepared Using Conventional and Microwave Sintering

Popis výsledku v původním jazyce

In this work, Eu2O3-doped (CaCu3Ti4O12)x of low dielectric loss have been fabricated using both conventional (CS) and microwave sintering (MWS), where x = Eu2O3 = 0.1, 0.2, and 0.3, respectively. According to X-ray diffraction (XRD) and scanning electron microscope (SEM) reports, increasing the concentration of Eu3+ in the CCTO lattice causes the grain size of the MWS samples to increase and vice versa for CS. The X-ray photoelectron spectroscopy (XPS) delineated the binding energies and charge states of the Cu2+/Cu+ and Ti4+/Ti3+ transition ions. Energy dispersive spectroscopy (EDS) analysis revealed no Cu-rich phase along the grain boundaries that directly impacts the dielectric properties. The dielectric characteristics, which include dielectric constant (ε) and the loss (tan δ), were examined using broadband dielectric spectrometer (BDS) from 10 to 107 Hz at ambient temperature. The dielectric constant was >104 and >102 for CS and MWS samples at x > 0.1, respectively, with the low loss being constant even at high frequencies due to the effective suppression of tan δ by Eu3+. This ceramic of low dielectric loss has potential for commercial applications at comparatively high frequencies.

Název v anglickém jazyce

Effect of Europium Addition on the Microstructure and Dielectric Properties of CCTO Ceramic Prepared Using Conventional and Microwave Sintering

Popis výsledku anglicky

In this work, Eu2O3-doped (CaCu3Ti4O12)x of low dielectric loss have been fabricated using both conventional (CS) and microwave sintering (MWS), where x = Eu2O3 = 0.1, 0.2, and 0.3, respectively. According to X-ray diffraction (XRD) and scanning electron microscope (SEM) reports, increasing the concentration of Eu3+ in the CCTO lattice causes the grain size of the MWS samples to increase and vice versa for CS. The X-ray photoelectron spectroscopy (XPS) delineated the binding energies and charge states of the Cu2+/Cu+ and Ti4+/Ti3+ transition ions. Energy dispersive spectroscopy (EDS) analysis revealed no Cu-rich phase along the grain boundaries that directly impacts the dielectric properties. The dielectric characteristics, which include dielectric constant (ε) and the loss (tan δ), were examined using broadband dielectric spectrometer (BDS) from 10 to 107 Hz at ambient temperature. The dielectric constant was >104 and >102 for CS and MWS samples at x > 0.1, respectively, with the low loss being constant even at high frequencies due to the effective suppression of tan δ by Eu3+. This ceramic of low dielectric loss has potential for commercial applications at comparatively high frequencies.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20504 - Ceramics

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Molecules

ISSN

1420-3049

e-ISSN

1420-3049

Svazek periodika

28

Číslo periodika v rámci svazku

4

Stát vydavatele periodika

CH - Švýcarská konfederace

Počet stran výsledku

11

Strana od-do

1649

Kód UT WoS článku

000940924700001

EID výsledku v databázi Scopus

2-s2.0-85149053007