SW Support for CCC and CQC Control Charts

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27230%2F14%3A86091514" target="_blank" >RIV/61989100:27230/14:86091514 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61989100:27360/14:86091514

Výsledek na webu

<a href="http://dx.doi.org/10.1109/CarpathianCC.2014.6843633" target="_blank" >http://dx.doi.org/10.1109/CarpathianCC.2014.6843633</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/CarpathianCC.2014.6843633" target="_blank" >10.1109/CarpathianCC.2014.6843633</a>

Jazyk výsledku

angličtina

Název v původním jazyce

SW Support for CCC and CQC Control Charts

Popis výsledku v původním jazyce

Statistical process control (SPC) is an approach to process control that has been widely used in any industrial or non-industrial fields. SPC is based on so called Shewhart´s conception of the process variability. This conception distinguishes variability caused by obviously effected common causes from variability caused by abnormal assignable causes. New manufacturing technologies and concepts strongly contributed to the real attainment of a high level of the processes capability. In such conditions adistinction of common variability causes from assignable causes is more and more difficult. Conventional attribute control charts are not adequate solution for monitoring and control of the processes with very low level of defects (in terms of ppm). Theanswer can be found in the application of CCC and CQC control charts. The paper deals with the presentation of the SW application which was created to contribute to the practical deployment of these effective control charting methods in p

Název v anglickém jazyce

SW Support for CCC and CQC Control Charts

Popis výsledku anglicky

Statistical process control (SPC) is an approach to process control that has been widely used in any industrial or non-industrial fields. SPC is based on so called Shewhart´s conception of the process variability. This conception distinguishes variability caused by obviously effected common causes from variability caused by abnormal assignable causes. New manufacturing technologies and concepts strongly contributed to the real attainment of a high level of the processes capability. In such conditions adistinction of common variability causes from assignable causes is more and more difficult. Conventional attribute control charts are not adequate solution for monitoring and control of the processes with very low level of defects (in terms of ppm). Theanswer can be found in the application of CCC and CQC control charts. The paper deals with the presentation of the SW application which was created to contribute to the practical deployment of these effective control charting methods in p

Druh

D - Stať ve sborníku

CEP obor

JS - Řízení spolehlivosti a kvality, zkušebnictví

OECD FORD obor

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Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of the 2014 15th International Carpathian Control Conference, ICCC 2014

ISBN

978-1-4799-3528-4

ISSN

—

e-ISSN

—

Počet stran výsledku

6

Strana od-do

387-392

Název nakladatele

IEEE Computer Society

Místo vydání

Los Alamitos

Místo konání akce

Velké Karlovice

Datum konání akce

28. 5. 2014

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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