Real-Time Analysis of Semiconductor Memories under the Influence of Ionizing Radiation

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27240%2F18%3A10241583" target="_blank" >RIV/61989100:27240/18:10241583 - isvavai.cz</a>

Výsledek na webu

<a href="https://ieeexplore.ieee.org/document/8323990" target="_blank" >https://ieeexplore.ieee.org/document/8323990</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/SAMI.2018.8323990" target="_blank" >10.1109/SAMI.2018.8323990</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Real-Time Analysis of Semiconductor Memories under the Influence of Ionizing Radiation

Popis výsledku v původním jazyce

This paper aims to analyze the influence of ionizing irradiation on various types of the semiconductor memories by means of the FPGA circuit logic. The reason for such tests is to determine the durability of digital electronics in the biomedicine, e. g. in pacemakers, during the radiotherapy. Static RAM EPROM and EEPROM memories were tested, which were tested, which were placed on a gamma-exposed test pad. As a source of the ionizing radiation, the TERAGAM irradiator and The Cyber Knife radio surgical instrument with a linear accelerator were used. The Memory Testing Controller is built on the FPGA chip that tests all the connected memories in parallel, and stores the detailed results in the event log.

Název v anglickém jazyce

Real-Time Analysis of Semiconductor Memories under the Influence of Ionizing Radiation

Popis výsledku anglicky

This paper aims to analyze the influence of ionizing irradiation on various types of the semiconductor memories by means of the FPGA circuit logic. The reason for such tests is to determine the durability of digital electronics in the biomedicine, e. g. in pacemakers, during the radiotherapy. Static RAM EPROM and EEPROM memories were tested, which were tested, which were placed on a gamma-exposed test pad. As a source of the ionizing radiation, the TERAGAM irradiator and The Cyber Knife radio surgical instrument with a linear accelerator were used. The Memory Testing Controller is built on the FPGA chip that tests all the connected memories in parallel, and stores the detailed results in the event log.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2018

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

SAMI 2018 - IEEE 16th World Symposium on Applied Machine Intelligence and Informatics Dedicated to the Memory of Pioneer of Robotics Antal (Tony) K. Bejczy, Proceedings

ISBN

978-1-5386-4772-1

ISSN

—

e-ISSN

neuvedeno

Počet stran výsledku

4

Strana od-do

81-84

Název nakladatele

IEEE

Místo vydání

Vienna

Místo konání akce

Kosice

Datum konání akce

7. 2. 2018

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000458546000017