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Thickness and Wavelength Optimizations of a High-Performance SPR Sensor Employing a Silver Layer and Black Phosphorus in Principal Directions

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27240%2F25%3A10257736" target="_blank" >RIV/61989100:27240/25:10257736 - isvavai.cz</a>

  • Výsledek na webu

    <a href="https://www.mdpi.com/2079-4991/15/11/790" target="_blank" >https://www.mdpi.com/2079-4991/15/11/790</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.3390/nano15110790" target="_blank" >10.3390/nano15110790</a>

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Thickness and Wavelength Optimizations of a High-Performance SPR Sensor Employing a Silver Layer and Black Phosphorus in Principal Directions

  • Popis výsledku v původním jazyce

    In this paper, we propose an innovative approach based on the wavelength optimization of a light source for a simple, high-performance surface plasmon resonance (SPR) sensor utilizing comprehensive reflectance analysis in the angular domain. The proposed structure consists of a glass substrate, an adhesion layer of titanium dioxide, a silver plasmonic layer, and a 2D material. Analysis is performed in the Kretschmann configuration for liquid analyte sensing. Sensing parameters such as the refractive index (RI) sensitivity, the reflectance minimum, and the figure of merit (FOM) are investigated in the first step of this study as a function of the thickness of the silver layer together with the RI of a coupling prism. Next, utilizing the results offering a fused silica prism, the thickness of the silver layer and the wavelength of the light source are optimized for the structure with the addition of a 2D material, black phosphorus (BP), which is studied along different principal directions, the zigzag and armchair directions. In addition, a new approach of adjusting the source wavelength using a one-dimensional photonic crystal combined with an LED, is presented. Based on this analysis, for the reference structure at a wavelength of 632.8 nm, the optimized silver layer thickness is 50 nm, and the achieved RI sensitivity ranges from 193.9 to 251.5 degrees per RI unit (deg/RIU), with the highest FOM reaching 52.3 RIU−1. In addition, for the modified structure with BP, the achieved RI sensitivity varies in the range of 269.1–351.2 deg/RIU at the optimized wavelength of 628 nm, with the highest FOM reaching 44.7 RIU−1 for the zigzag direction. Due to the optimization and adjusting the wavelength of the source, the results obtained for the proposed SPR structure could have significant implications for the development of more sensitive and efficient sensors employing a simple plasmonic structure.

  • Název v anglickém jazyce

    Thickness and Wavelength Optimizations of a High-Performance SPR Sensor Employing a Silver Layer and Black Phosphorus in Principal Directions

  • Popis výsledku anglicky

    In this paper, we propose an innovative approach based on the wavelength optimization of a light source for a simple, high-performance surface plasmon resonance (SPR) sensor utilizing comprehensive reflectance analysis in the angular domain. The proposed structure consists of a glass substrate, an adhesion layer of titanium dioxide, a silver plasmonic layer, and a 2D material. Analysis is performed in the Kretschmann configuration for liquid analyte sensing. Sensing parameters such as the refractive index (RI) sensitivity, the reflectance minimum, and the figure of merit (FOM) are investigated in the first step of this study as a function of the thickness of the silver layer together with the RI of a coupling prism. Next, utilizing the results offering a fused silica prism, the thickness of the silver layer and the wavelength of the light source are optimized for the structure with the addition of a 2D material, black phosphorus (BP), which is studied along different principal directions, the zigzag and armchair directions. In addition, a new approach of adjusting the source wavelength using a one-dimensional photonic crystal combined with an LED, is presented. Based on this analysis, for the reference structure at a wavelength of 632.8 nm, the optimized silver layer thickness is 50 nm, and the achieved RI sensitivity ranges from 193.9 to 251.5 degrees per RI unit (deg/RIU), with the highest FOM reaching 52.3 RIU−1. In addition, for the modified structure with BP, the achieved RI sensitivity varies in the range of 269.1–351.2 deg/RIU at the optimized wavelength of 628 nm, with the highest FOM reaching 44.7 RIU−1 for the zigzag direction. Due to the optimization and adjusting the wavelength of the source, the results obtained for the proposed SPR structure could have significant implications for the development of more sensitive and efficient sensors employing a simple plasmonic structure.

Klasifikace

  • Druh

    J<sub>imp</sub> - Článek v periodiku v databázi Web of Science

  • CEP obor

  • OECD FORD obor

    10306 - Optics (including laser optics and quantum optics)

Návaznosti výsledku

  • Projekt

    <a href="/cs/project/EF17_048%2F0007399" target="_blank" >EF17_048/0007399: Nové kompozitní materiály pro environmentální aplikace</a><br>

  • Návaznosti

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Ostatní

  • Rok uplatnění

    2025

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název periodika

    Nanomaterials

  • ISSN

    2079-4991

  • e-ISSN

    2079-4991

  • Svazek periodika

    15

  • Číslo periodika v rámci svazku

    11

  • Stát vydavatele periodika

    CH - Švýcarská konfederace

  • Počet stran výsledku

    14

  • Strana od-do

    "790(1)"-"790(14)"

  • Kód UT WoS článku

    001505813100001

  • EID výsledku v databázi Scopus