Critical parameters in controlling dislocation nucleation at twisted semicoherent interfaces

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27240%2F25%3A10258675" target="_blank" >RIV/61989100:27240/25:10258675 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216208:11320/25:10500265 RIV/61989100:27740/25:10258675

Výsledek na webu

<a href="https://www.sciencedirect.com/science/article/pii/S092702562500463X?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/pii/S092702562500463X?via%3Dihub</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.commatsci.2025.114120" target="_blank" >10.1016/j.commatsci.2025.114120</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Critical parameters in controlling dislocation nucleation at twisted semicoherent interfaces

Popis výsledku v původním jazyce

Hetero-phase interfaces typically accommodate misfit dislocations, which dominate the interface-facilitated plasticity. Despite advancements in understanding such plasticity, the complexity of interface degrees of freedom has overshadowed the exploration of related dependent parameters. In this study, we present a novel investigation to systematically analyze critical parameters influencing dislocation nucleation at semicoherent interfaces by twisting one phase against the other. Our results reveal variations in critical nucleation stress with node distance, line-orientation misalignment, and spiral features around the nodes. To quantify these correlations semi-quantitatively, we propose Orowan and misalignment descriptors that incorporate the effect of node distance and the combined influence of line-orientation misalignment and spiral features around the nodes. These descriptors determine transitions from Friedel-Escaig-like to partially aligned, fully aligned, and misaligned Fleischer-like cross-slip mechanisms. These findings establish a clear structure-property relationship at hetero-phase interfaces and enable high-performance alloy design through interface engineering.

Název v anglickém jazyce

Critical parameters in controlling dislocation nucleation at twisted semicoherent interfaces

Popis výsledku anglicky

Hetero-phase interfaces typically accommodate misfit dislocations, which dominate the interface-facilitated plasticity. Despite advancements in understanding such plasticity, the complexity of interface degrees of freedom has overshadowed the exploration of related dependent parameters. In this study, we present a novel investigation to systematically analyze critical parameters influencing dislocation nucleation at semicoherent interfaces by twisting one phase against the other. Our results reveal variations in critical nucleation stress with node distance, line-orientation misalignment, and spiral features around the nodes. To quantify these correlations semi-quantitatively, we propose Orowan and misalignment descriptors that incorporate the effect of node distance and the combined influence of line-orientation misalignment and spiral features around the nodes. These descriptors determine transitions from Friedel-Escaig-like to partially aligned, fully aligned, and misaligned Fleischer-like cross-slip mechanisms. These findings establish a clear structure-property relationship at hetero-phase interfaces and enable high-performance alloy design through interface engineering.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

—

Návaznosti

—

Rok uplatnění

2025

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Computational Materials Science

ISSN

0927-0256

e-ISSN

1879-0801

Svazek periodika

258

Číslo periodika v rámci svazku

AUG 2025

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

7

Strana od-do

114120

Kód UT WoS článku

001536312600001

EID výsledku v databázi Scopus

2-s2.0-105011041920