Measurement uncertainty of phase measuring deflectometry

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989592%3A15310%2F23%3A73620193" target="_blank" >RIV/61989592:15310/23:73620193 - isvavai.cz</a>

Výsledek na webu

<a href="https://opg.optica.org/ao/viewmedia.cfm?uri=ao-62-7-1769&seq=0" target="_blank" >https://opg.optica.org/ao/viewmedia.cfm?uri=ao-62-7-1769&seq=0</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/AO.483720" target="_blank" >10.1364/AO.483720</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Measurement uncertainty of phase measuring deflectometry

Popis výsledku v původním jazyce

Phase measuring deflectometry (PMD) is a proven optical measurement method for measuring the shapes of objects. This method is suitable for measuring the shape of an object with an optically smooth (mirror-like) surface. The measured object is used as a mirror through which the camera observes a defined geometric pattern. We derive the theoretical limit of measurement uncertainty using the Cramer-Rao inequality. It shows that the measurement uncertainty is expressed in the form of an uncertainty product. The factors of the product are the angular uncer-tainty and lateral resolution. The magnitude of the uncertainty product depends on the mean wavelength of the light used and the number of photons detected. The calculated measurement uncertainty is compared with the measurement uncertainty of other deflectometry methods

Název v anglickém jazyce

Measurement uncertainty of phase measuring deflectometry

Popis výsledku anglicky

Phase measuring deflectometry (PMD) is a proven optical measurement method for measuring the shapes of objects. This method is suitable for measuring the shape of an object with an optically smooth (mirror-like) surface. The measured object is used as a mirror through which the camera observes a defined geometric pattern. We derive the theoretical limit of measurement uncertainty using the Cramer-Rao inequality. It shows that the measurement uncertainty is expressed in the form of an uncertainty product. The factors of the product are the angular uncer-tainty and lateral resolution. The magnitude of the uncertainty product depends on the mean wavelength of the light used and the number of photons detected. The calculated measurement uncertainty is compared with the measurement uncertainty of other deflectometry methods

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

<a href="/cs/project/EF16_019%2F0000754" target="_blank" >EF16_019/0000754: Nanotechnologie pro budoucnost</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Applied Optics

ISSN

1559-128X

e-ISSN

2155-3165

Svazek periodika

62

Číslo periodika v rámci svazku

7

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

1769-1776

Kód UT WoS článku

000952540800003

EID výsledku v databázi Scopus

2-s2.0-85149103221