Generalized Multimode SIW Cavity-Based Sensor for Retrieval of Complex Permittivity of Materials

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F18%3A00503508" target="_blank" >RIV/67985882:_____/18:00503508 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1109/TMTT.2018.2830332" target="_blank" >http://dx.doi.org/10.1109/TMTT.2018.2830332</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/TMTT.2018.2830332" target="_blank" >10.1109/TMTT.2018.2830332</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Generalized Multimode SIW Cavity-Based Sensor for Retrieval of Complex Permittivity of Materials

Popis výsledku v původním jazyce

In this paper, the generalized substrate integrated waveguide (SIW) cavity technique is presented for the retrieval of broadband complex permittivity of medium loss dielectrics using a number of higher order modes of the proposed cavity. The proposed SIW cavity design improves the coupling by implementing a novel feeding topology to achieve a better quality factor for the higher order TE10n modes as compared with the conventional SIW feeding arrangement. The conventional SIW cavity perturbation formula is modified to overcome various limitations of the SIW topology, such as the lower Q-factor, lower sample to cavity volume ratio, and larger frequency shifts observed for the higher order modes. The applicability of the proposed technique is first numerically validated using independent data obtained with the help of full-wave electromagnetic solver, and then, the accuracy is compared with various cavity based techniques available in the literature. Finally, the proposed SIW cavity sensor is fabricated on Rogers' RT5880 substrate, where a number of standard RF substrates are tested using the network analyzer. The proposed generalized scheme based on the improved SIW cavity provides reasonably accurate values of the complex permittivity of the medium-loss dielectric substrates at multiband of microwave frequency in the range of 10-20 GHz

Název v anglickém jazyce

Generalized Multimode SIW Cavity-Based Sensor for Retrieval of Complex Permittivity of Materials

Popis výsledku anglicky

In this paper, the generalized substrate integrated waveguide (SIW) cavity technique is presented for the retrieval of broadband complex permittivity of medium loss dielectrics using a number of higher order modes of the proposed cavity. The proposed SIW cavity design improves the coupling by implementing a novel feeding topology to achieve a better quality factor for the higher order TE10n modes as compared with the conventional SIW feeding arrangement. The conventional SIW cavity perturbation formula is modified to overcome various limitations of the SIW topology, such as the lower Q-factor, lower sample to cavity volume ratio, and larger frequency shifts observed for the higher order modes. The applicability of the proposed technique is first numerically validated using independent data obtained with the help of full-wave electromagnetic solver, and then, the accuracy is compared with various cavity based techniques available in the literature. Finally, the proposed SIW cavity sensor is fabricated on Rogers' RT5880 substrate, where a number of standard RF substrates are tested using the network analyzer. The proposed generalized scheme based on the improved SIW cavity provides reasonably accurate values of the complex permittivity of the medium-loss dielectric substrates at multiband of microwave frequency in the range of 10-20 GHz

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2018

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

IEEE Transactions on Microwave Theory and Techniques

ISSN

0018-9480

e-ISSN

—

Svazek periodika

66

Číslo periodika v rámci svazku

6

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

10

Strana od-do

3063-3072

Kód UT WoS článku

000434463600017

EID výsledku v databázi Scopus

2-s2.0-85046720864