Focused ion beam assisted prototyping of graphene/ZnO devices on Zn-polar and O-polar faces of ZnO bulk crystals

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F22%3A00562514" target="_blank" >RIV/67985882:_____/22:00562514 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1016/j.physe.2021.115006" target="_blank" >https://doi.org/10.1016/j.physe.2021.115006</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.physe.2021.115006" target="_blank" >10.1016/j.physe.2021.115006</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Focused ion beam assisted prototyping of graphene/ZnO devices on Zn-polar and O-polar faces of ZnO bulk crystals

Popis výsledku v původním jazyce

We demonstrate an experimental approach for prototyping heterojunctions formed between graphene and bulk semiconductor substrates. This approach employs focused ion beam milling to fabricate microscale area heterojunctions and in-situ electrical measurements in the chamber of the scanning electron microscope to measure their electrical characteristics. The aim is to limit the impact of defects in graphene on the electrical characteristics of the junctions. The approach is demonstrated on graphene/ZnO structures with different polar faces. On these structures, theoretical predictions pointing to differences in charge transport are experimentally validated

Název v anglickém jazyce

Focused ion beam assisted prototyping of graphene/ZnO devices on Zn-polar and O-polar faces of ZnO bulk crystals

Popis výsledku anglicky

We demonstrate an experimental approach for prototyping heterojunctions formed between graphene and bulk semiconductor substrates. This approach employs focused ion beam milling to fabricate microscale area heterojunctions and in-situ electrical measurements in the chamber of the scanning electron microscope to measure their electrical characteristics. The aim is to limit the impact of defects in graphene on the electrical characteristics of the junctions. The approach is demonstrated on graphene/ZnO structures with different polar faces. On these structures, theoretical predictions pointing to differences in charge transport are experimentally validated

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

<a href="/cs/project/GA20-24366S" target="_blank" >GA20-24366S: Studium mechanizmů transportu náboje přechodu grafen-polovodič</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2022

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Physica E: Low-Dimensional Systems and Nanostructures

ISSN

1386-9477

e-ISSN

1873-1759

Svazek periodika

136

Číslo periodika v rámci svazku

February

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

5

Strana od-do

115006

Kód UT WoS článku

000712093100004

EID výsledku v databázi Scopus

2-s2.0-85116904652