The influence of long-term annealing at room temperature on creep behaviour of ECAP-processed copper

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F17%3A00470411" target="_blank" >RIV/68081723:_____/17:00470411 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.matlet.2016.11.002" target="_blank" >http://dx.doi.org/10.1016/j.matlet.2016.11.002</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.matlet.2016.11.002" target="_blank" >10.1016/j.matlet.2016.11.002</a>

Jazyk výsledku

angličtina

Název v původním jazyce

The influence of long-term annealing at room temperature on creep behaviour of ECAP-processed copper

Popis výsledku v původním jazyce

Present work investigates the effect of long-term annealing at low homologous temperature (~0.22 Tm) on creepnbehaviour of pure copper (99.99%) processed by equal-channel angular pressing (ECAP). Coarse-grained purencopper was processed by 1 and 8 ECAP passes at room temperature. The ECAP-processed specimens werenannealed at room temperature for 3 years. Microstructures of ECAP-processed specimens and their roomntemperature-annealed states were investigated by electron back scatter diffraction (EBSD) technique. Tensilentests were performed at room temperature under constant rate and at 373 K in creep under constant load. It wasnfound that long-term annealing at room temperature led to occurrence of large grains in microstructure whichninfluenced the strength. The influence grew with number of ECAP passes.

Název v anglickém jazyce

The influence of long-term annealing at room temperature on creep behaviour of ECAP-processed copper

Popis výsledku anglicky

Present work investigates the effect of long-term annealing at low homologous temperature (~0.22 Tm) on creepnbehaviour of pure copper (99.99%) processed by equal-channel angular pressing (ECAP). Coarse-grained purencopper was processed by 1 and 8 ECAP passes at room temperature. The ECAP-processed specimens werenannealed at room temperature for 3 years. Microstructures of ECAP-processed specimens and their roomntemperature-annealed states were investigated by electron back scatter diffraction (EBSD) technique. Tensilentests were performed at room temperature under constant rate and at 373 K in creep under constant load. It wasnfound that long-term annealing at room temperature led to occurrence of large grains in microstructure whichninfluenced the strength. The influence grew with number of ECAP passes.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20501 - Materials engineering

Projekt

<a href="/cs/project/LQ1601" target="_blank" >LQ1601: CEITEC 2020</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Materials Letters

ISSN

0167-577X

e-ISSN

—

Svazek periodika

188

Číslo periodika v rámci svazku

FEB

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

4

Strana od-do

235-238

Kód UT WoS článku

000390740500063

EID výsledku v databázi Scopus

2-s2.0-85006298248