Field Ion Microscopy of Tungsten Nano-Tips Coated with Thin Layer of Epoxy Resin

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F24%3A00600424" target="_blank" >RIV/68081723:_____/24:00600424 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68081731:_____/24:00600424 RIV/00216305:26220/24:PU155800

Výsledek na webu

<a href="https://www.mdpi.com/2227-7080/12/10/193" target="_blank" >https://www.mdpi.com/2227-7080/12/10/193</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.3390/technologies12100193" target="_blank" >10.3390/technologies12100193</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Field Ion Microscopy of Tungsten Nano-Tips Coated with Thin Layer of Epoxy Resin

Popis výsledku v původním jazyce

This paper presents an analysis of the field ion emission mechanism of tungsten-epoxy nanocomposite emitters and compares their performance with that of tungsten nano-field emitters. The emission mechanism is described using the theory of induced conductive channels. Tungsten emitters with a radius of 70 nm were fabricated using electrochemical polishing and coated with a 20 nm epoxy resin layer. Characterization of the emitters, both before and after coating, was performed using electron microscopy and energy-dispersive X-ray spectroscopy (EDS). The Tungsten nanocomposite emitter was tested using a field ion microscope (FIM) in the voltage range of 0-15 kV. The FIM analyses revealed differences in the emission ion density distributions between the uncoated and coated emitters. The uncoated tungsten tips exhibited the expected crystalline surface atomic distribution in the FIM images, whereas the coated emitters displayed randomly distributed emission spots, indicating the formation of induced conductive channels within the resin layer. The atom probe results are consistent with the FIM findings, suggesting that the formation of conductive channels is more likely to occur in areas where the resin surface is irregular and exhibits protrusions. These findings highlight the distinct emission mechanisms of both emitter types.

Název v anglickém jazyce

Field Ion Microscopy of Tungsten Nano-Tips Coated with Thin Layer of Epoxy Resin

Popis výsledku anglicky

This paper presents an analysis of the field ion emission mechanism of tungsten-epoxy nanocomposite emitters and compares their performance with that of tungsten nano-field emitters. The emission mechanism is described using the theory of induced conductive channels. Tungsten emitters with a radius of 70 nm were fabricated using electrochemical polishing and coated with a 20 nm epoxy resin layer. Characterization of the emitters, both before and after coating, was performed using electron microscopy and energy-dispersive X-ray spectroscopy (EDS). The Tungsten nanocomposite emitter was tested using a field ion microscope (FIM) in the voltage range of 0-15 kV. The FIM analyses revealed differences in the emission ion density distributions between the uncoated and coated emitters. The uncoated tungsten tips exhibited the expected crystalline surface atomic distribution in the FIM images, whereas the coated emitters displayed randomly distributed emission spots, indicating the formation of induced conductive channels within the resin layer. The atom probe results are consistent with the FIM findings, suggesting that the formation of conductive channels is more likely to occur in areas where the resin surface is irregular and exhibits protrusions. These findings highlight the distinct emission mechanisms of both emitter types.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

21001 - Nano-materials (production and properties)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Technologies

ISSN

2227-7080

e-ISSN

2227-7080

Svazek periodika

12

Číslo periodika v rámci svazku

10

Stát vydavatele periodika

CH - Švýcarská konfederace

Počet stran výsledku

13

Strana od-do

193

Kód UT WoS článku

001342552100001

EID výsledku v databázi Scopus

2-s2.0-85207682950