Optical Properties of Yttrium Ferrite Films Prepared by Pulse Laser Deposition

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081723%3A_____%2F24%3A00602394" target="_blank" >RIV/68081723:_____/24:00602394 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216305:26220/24:PU156014

Výsledek na webu

<a href="https://www.mdpi.com/2079-6412/14/11/1464" target="_blank" >https://www.mdpi.com/2079-6412/14/11/1464</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.3390/coatings14111464" target="_blank" >10.3390/coatings14111464</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Optical Properties of Yttrium Ferrite Films Prepared by Pulse Laser Deposition

Popis výsledku v původním jazyce

This study investigates the optical properties of yttrium ferrite thin films fabricated via pulse laser deposition. Yttrium orthoferrite, a ferrimagnetic material known for its potential applications in spintronics and photonics, was deposited on single-crystal substrates under controlled conditions to analyze its optical characteristics. The influence of deposition time on the film quality and optical properties was examined. Atomic force microscopy in contact mode revealed surface roughness variations up to 35 nm, indicating the films' ability to cover substrate defects. Reflectance measurements determined the optical band gap, which decreased from 3.17 eV for thinner films (44 nm) to 2.91 eV for thicker films (93 nm). Forbidden electronic transitions were also observed, attributed to heteroepitaxial growth and phonon interactions. These results demonstrate the effect of film thickness on morphology and optical properties, making YFeO3 films promising for a range of optoelectronic applications.

Název v anglickém jazyce

Optical Properties of Yttrium Ferrite Films Prepared by Pulse Laser Deposition

Popis výsledku anglicky

This study investigates the optical properties of yttrium ferrite thin films fabricated via pulse laser deposition. Yttrium orthoferrite, a ferrimagnetic material known for its potential applications in spintronics and photonics, was deposited on single-crystal substrates under controlled conditions to analyze its optical characteristics. The influence of deposition time on the film quality and optical properties was examined. Atomic force microscopy in contact mode revealed surface roughness variations up to 35 nm, indicating the films' ability to cover substrate defects. Reflectance measurements determined the optical band gap, which decreased from 3.17 eV for thinner films (44 nm) to 2.91 eV for thicker films (93 nm). Forbidden electronic transitions were also observed, attributed to heteroepitaxial growth and phonon interactions. These results demonstrate the effect of film thickness on morphology and optical properties, making YFeO3 films promising for a range of optoelectronic applications.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20506 - Coating and films

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Coatings

ISSN

2079-6412

e-ISSN

2079-6412

Svazek periodika

14

Číslo periodika v rámci svazku

11

Stát vydavatele periodika

CH - Švýcarská konfederace

Počet stran výsledku

17

Strana od-do

1464

Kód UT WoS článku

001364121300001

EID výsledku v databázi Scopus

2-s2.0-85210233542