Graphene examined with very slow electrons

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F15%3A00450825" target="_blank" >RIV/68081731:_____/15:00450825 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Graphene examined with very slow electrons

Popis výsledku v původním jazyce

Electron microscopy of materials composed of light elements suffers from low image contrast, particularly in the transmission microscopy of biomedical specimens. Post-fixation or staining with heavy metal salts that highlight certain structural details is a partially successful aid in routine microscopy. In order to examine mutually overlapped flakes of two-dimensional crystals such as graphene we need to obtain a contrast contribution from a single layer of carbon atoms. This task requires increasing the scattering rate of incident electrons by means of a drastic lowering of their energy to hundreds of eV or less. The cathode lens principle implemented in the SEM, and recently in the STEM mode as well, makes it possible to use an arbitrarily low energy in both reflection and transmission modes. Contrasts between sites differing in thickness by a single graphene layer are demonstrated at 220 eV. The high lateral resolution of ultra-low-energy STEM with a cathode lens enabled us to meas

Název v anglickém jazyce

Graphene examined with very slow electrons

Popis výsledku anglicky

Electron microscopy of materials composed of light elements suffers from low image contrast, particularly in the transmission microscopy of biomedical specimens. Post-fixation or staining with heavy metal salts that highlight certain structural details is a partially successful aid in routine microscopy. In order to examine mutually overlapped flakes of two-dimensional crystals such as graphene we need to obtain a contrast contribution from a single layer of carbon atoms. This task requires increasing the scattering rate of incident electrons by means of a drastic lowering of their energy to hundreds of eV or less. The cathode lens principle implemented in the SEM, and recently in the STEM mode as well, makes it possible to use an arbitrarily low energy in both reflection and transmission modes. Contrasts between sites differing in thickness by a single graphene layer are demonstrated at 220 eV. The high lateral resolution of ultra-low-energy STEM with a cathode lens enabled us to meas

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/TE01020118" target="_blank" >TE01020118: Elektronová mikroskopie</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2015

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

12th Multinational Congress on Microscopy

ISBN

978-963-05-9653-4

ISSN

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e-ISSN

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Počet stran výsledku

2

Strana od-do

182-183

Název nakladatele

Akadémiai Kiadó

Místo vydání

Budapest

Místo konání akce

Eger

Datum konání akce

23. 8. 2015

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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