Effect of Native Oxide on Reflectivity of Slow and Super Slow Electrons from Mild Steel Surface

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F20%3A00536023" target="_blank" >RIV/68081731:_____/20:00536023 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/effect-of-native-oxide-on-reflectivity-of-slow-and-super-slow-electrons-from-mild-steel-surface/A38DD155B92DD04E066D1DB4E6CE86FC" target="_blank" >https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/effect-of-native-oxide-on-reflectivity-of-slow-and-super-slow-electrons-from-mild-steel-surface/A38DD155B92DD04E066D1DB4E6CE86FC</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1017/S1431927620016669" target="_blank" >10.1017/S1431927620016669</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Effect of Native Oxide on Reflectivity of Slow and Super Slow Electrons from Mild Steel Surface

Popis výsledku v původním jazyce

Modern commercial scanning electron microscopes (SEMs) are equipped with a cathode lens mode, which enables us to use extremely low landing energies of the primary electrons. There are many benefits of the low energy electron microscopy and this technique has been recognized as an important tool for the characterization of advanced steels. At lower energies, the contrast in SEM micrographs is more and more influenced by the surface and its state. In this study, we investigated the effect of a native oxide layer on the contrast in SEM images of a mild steel surface obtained at energies from 5 keV up to units of eV shows a series of the SEM micrographs of mild steel collected by anin-house designed ultra-high vacuum scanning low energy electron microscope (UHV SLEEM). The micrographs of the same area of view were obtained with various landing energies of the primary beam.

Název v anglickém jazyce

Effect of Native Oxide on Reflectivity of Slow and Super Slow Electrons from Mild Steel Surface

Popis výsledku anglicky

Modern commercial scanning electron microscopes (SEMs) are equipped with a cathode lens mode, which enables us to use extremely low landing energies of the primary electrons. There are many benefits of the low energy electron microscopy and this technique has been recognized as an important tool for the characterization of advanced steels. At lower energies, the contrast in SEM micrographs is more and more influenced by the surface and its state. In this study, we investigated the effect of a native oxide layer on the contrast in SEM images of a mild steel surface obtained at energies from 5 keV up to units of eV shows a series of the SEM micrographs of mild steel collected by anin-house designed ultra-high vacuum scanning low energy electron microscope (UHV SLEEM). The micrographs of the same area of view were obtained with various landing energies of the primary beam.

Druh

J_ost - Ostatní články v recenzovaných periodicích

CEP obor

—

OECD FORD obor

20501 - Materials engineering

Projekt

<a href="/cs/project/TN01000008" target="_blank" >TN01000008: Centrum elektronové a fotonové optiky</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Microscopy and Microanalysis

ISSN

1431-9276

e-ISSN

—

Svazek periodika

26

Číslo periodika v rámci svazku

S2

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

3

Strana od-do

1012-1014

Kód UT WoS článku

—

EID výsledku v databázi Scopus

—