TRIP steel microstructure visualized by slow and very slow electrons

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F13%3A00420896" target="_blank" >RIV/68081731:_____/13:00420896 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1093/jmicro/dft036" target="_blank" >http://dx.doi.org/10.1093/jmicro/dft036</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1093/jmicro/dft036" target="_blank" >10.1093/jmicro/dft036</a>

Jazyk výsledku

angličtina

Název v původním jazyce

TRIP steel microstructure visualized by slow and very slow electrons

Popis výsledku v původním jazyce

The aim of the present paper is to demonstrate the ability of the scanning low-energy electron microscopy to visualize the transformed induced plasticity steel microstructure with extremely high sensitivity. Using the retarding mode in the scanning electron microscope, the high contrast between the individual phases has been obtained, which enables us to differentiate the retained austenite and the other phases. The sets of the micrographs have been collected from the sample at a wide range of landing energies of primary electrons from 50 eV to 10 keV and the dependence of the contrast between the phases on the landing energy has been calculated. Upon a comparison of these contrast curves, the optimal conditions for achieving of maximum contrast have been established.

Název v anglickém jazyce

TRIP steel microstructure visualized by slow and very slow electrons

Popis výsledku anglicky

The aim of the present paper is to demonstrate the ability of the scanning low-energy electron microscopy to visualize the transformed induced plasticity steel microstructure with extremely high sensitivity. Using the retarding mode in the scanning electron microscope, the high contrast between the individual phases has been obtained, which enables us to differentiate the retained austenite and the other phases. The sets of the micrographs have been collected from the sample at a wide range of landing energies of primary electrons from 50 eV to 10 keV and the dependence of the contrast between the phases on the landing energy has been calculated. Upon a comparison of these contrast curves, the optimal conditions for achieving of maximum contrast have been established.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

—

Projekt

<a href="/cs/project/TE01020118" target="_blank" >TE01020118: Elektronová mikroskopie</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Microscopy

ISSN

2050-5698

e-ISSN

—

Svazek periodika

62

Číslo periodika v rámci svazku

6

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

8

Strana od-do

589-596

Kód UT WoS článku

000328365600005

EID výsledku v databázi Scopus

—