Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00465206" target="_blank" >RIV/68081731:_____/16:00465206 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/60077344:_____/16:00465206

Výsledek na webu

<a href="http://dx.doi.org/10.1017/S143192761600547X" target="_blank" >http://dx.doi.org/10.1017/S143192761600547X</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1017/S143192761600547X" target="_blank" >10.1017/S143192761600547X</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Popis výsledku v původním jazyce

Low voltage TEM and STEM (transmission and scanning transmission electron microscope) can be regarded as the method of choice for many structural studies of very thin biological samples like ultrathin sections, viruses etc.. Usually, in a conventional TEM (typical acceleration voltage 60 – 300 kV) the image contrast is enhanced by staining using salts of heavy metals (e.g., uranyl acetate, lead citrate). Low voltage STEM allows to image unstained samples that usually show sufficient contrast, but in some cases the staining can be useful. An important parameter for imaging is a sensitivity of the sample to degradation by electron beam. There have been not many studies describing quantitatively the mass loss of the resin sections; the most comprehensive work was performed on the dedicated STEM for molecular mass measurements done at 80 keV, or even at higher electron energies done by EFTEM. The author in [6] describes that polymers stained with a heavy metal should therefore damage more rapidly through the secondary electron mechanism and higher cross sections for scattering.

Název v anglickém jazyce

Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Popis výsledku anglicky

Low voltage TEM and STEM (transmission and scanning transmission electron microscope) can be regarded as the method of choice for many structural studies of very thin biological samples like ultrathin sections, viruses etc.. Usually, in a conventional TEM (typical acceleration voltage 60 – 300 kV) the image contrast is enhanced by staining using salts of heavy metals (e.g., uranyl acetate, lead citrate). Low voltage STEM allows to image unstained samples that usually show sufficient contrast, but in some cases the staining can be useful. An important parameter for imaging is a sensitivity of the sample to degradation by electron beam. There have been not many studies describing quantitatively the mass loss of the resin sections; the most comprehensive work was performed on the dedicated STEM for molecular mass measurements done at 80 keV, or even at higher electron energies done by EFTEM. The author in [6] describes that polymers stained with a heavy metal should therefore damage more rapidly through the secondary electron mechanism and higher cross sections for scattering.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Microscopy and Microanalysis

ISSN

1431-9276

e-ISSN

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Svazek periodika

22

Číslo periodika v rámci svazku

S3

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

2

Strana od-do

926-927

Kód UT WoS článku

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EID výsledku v databázi Scopus

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