Programmable set-up for electrochemical preparation of STM tips and ultra-sharp field emission cathodes

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F17%3A00477724" target="_blank" >RIV/68081731:_____/17:00477724 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.mee.2017.04.002" target="_blank" >http://dx.doi.org/10.1016/j.mee.2017.04.002</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.mee.2017.04.002" target="_blank" >10.1016/j.mee.2017.04.002</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Programmable set-up for electrochemical preparation of STM tips and ultra-sharp field emission cathodes

Popis výsledku v původním jazyce

This paper describes a newly designed set-up which is intended for automated preparation both for STM tips and for ultra-sharp field emission cathodes made of polycrystalline and single crystal tungsten in laboratory conditions. The newly designed set-up incorporates electrochemical etching of a wire in the surface layer of an electrolyte and also the so called drop-off method which consists of two steps and requires more precise wire and current setting. Additionally, the method was extended for polycrystalline wires of tungsten using a special cut-off algorithm, which deals with variable etching speed for various crystallographic orientation of the current grain. Produced tips are examined using scanning low energy electron microscopy as for the surface and by the occurrence of electron field-emission as for the geometry based on the Fowler-Nordheim analysis. STM performance of the produced tip is discussed and examined as well.

Název v anglickém jazyce

Programmable set-up for electrochemical preparation of STM tips and ultra-sharp field emission cathodes

Popis výsledku anglicky

This paper describes a newly designed set-up which is intended for automated preparation both for STM tips and for ultra-sharp field emission cathodes made of polycrystalline and single crystal tungsten in laboratory conditions. The newly designed set-up incorporates electrochemical etching of a wire in the surface layer of an electrolyte and also the so called drop-off method which consists of two steps and requires more precise wire and current setting. Additionally, the method was extended for polycrystalline wires of tungsten using a special cut-off algorithm, which deals with variable etching speed for various crystallographic orientation of the current grain. Produced tips are examined using scanning low energy electron microscopy as for the surface and by the occurrence of electron field-emission as for the geometry based on the Fowler-Nordheim analysis. STM performance of the produced tip is discussed and examined as well.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20402 - Chemical process engineering

Projekt

<a href="/cs/project/LO1212" target="_blank" >LO1212: ALISI - Centrum pokročilých diagnostických metod a technologií</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Microelectronic Engineering

ISSN

0167-9317

e-ISSN

—

Svazek periodika

173

Číslo periodika v rámci svazku

APR 5

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

6

Strana od-do

42-47

Kód UT WoS článku

000401387400007

EID výsledku v databázi Scopus

2-s2.0-85017322634