Treatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons

Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F20%3A00551134" target="_blank" >RIV/68081731:_____/20:00551134 - isvavai.cz</a>
Výsledek na webu
<a href="https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/treatment-and-observation-of-advanced-carbonbased-nanomaterials-by-slow-electrons/6CE85FB178C91C6867E73A3AEBD6DE2D" target="_blank" >https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/treatment-and-observation-of-advanced-carbonbased-nanomaterials-by-slow-electrons/6CE85FB178C91C6867E73A3AEBD6DE2D</a>
DOI - Digital Object Identifier
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Jazyk výsledku
angličtina
Název v původním jazyce
Treatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons
Popis výsledku v původním jazyce
The development of new types of materials such as advanced carbon-based nanostructures also requires the development of new surface sensitive characterization techniques to fully unravel the materials' structures. With regards to surface sensitive materials, low energy electron microscopy can be a very powerful tool for precise study of these sensitive materials. The samples were studied by a unique method involving scanning low energy electron microscopy (SLEEM, SEM equipped with a cathode lens system - CL) and low voltage scanning transmission electron microscopy (LV STEM).
Název v anglickém jazyce
Treatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons
Popis výsledku anglicky
The development of new types of materials such as advanced carbon-based nanostructures also requires the development of new surface sensitive characterization techniques to fully unravel the materials' structures. With regards to surface sensitive materials, low energy electron microscopy can be a very powerful tool for precise study of these sensitive materials. The samples were studied by a unique method involving scanning low energy electron microscopy (SLEEM, SEM equipped with a cathode lens system - CL) and low voltage scanning transmission electron microscopy (LV STEM).

Projekt
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Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění
2020
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Podobné výsledky(10)