Low-temperature emissivity of thin Al2O3 layers deposited on copper substrate
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F21%3A00552663" target="_blank" >RIV/68081731:_____/21:00552663 - isvavai.cz</a>
Výsledek na webu
<a href="https://iifiir.org/fr/fridoc/emissivite-a-basse-temperature-de-couches-minces-144402" target="_blank" >https://iifiir.org/fr/fridoc/emissivite-a-basse-temperature-de-couches-minces-144402</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.18462/iir.cryo.2021.0042" target="_blank" >10.18462/iir.cryo.2021.0042</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Low-temperature emissivity of thin Al2O3 layers deposited on copper substrate
Popis výsledku v původním jazyce
Copper is commonly used in cryogenic systems due to its high thermal and electrical conductivity along with excellent solderability. Very low emissivity values of copper surface also reduce in cryogenic systems heat load transferred by thermal radiation. These values may be, however, enhanced by a prospective coating, deposited usually in order to prevent chemical changes on highly reactive copper surface. This paper focuses on protective layers of Al2O3 with thicknesses up to 28 nm, deposited on polished copper. We measured total hemispherical emissivity at cryogenic temperatures before and after the coating process. Contribution of Al2O3 layer to original copper emissivity increased with rising temperature of the layer and with the layer thickness. However, emissivity of the coated copper stayed below 2%, allowing usage of the coated copper in systems where low heat load by thermal radiation is needed. Preliminary tests with oxygen plasma shows that deposited layers can effectively protect the copper surface against oxidation and maintain the original thermal-radiative properties.
Název v anglickém jazyce
Low-temperature emissivity of thin Al2O3 layers deposited on copper substrate
Popis výsledku anglicky
Copper is commonly used in cryogenic systems due to its high thermal and electrical conductivity along with excellent solderability. Very low emissivity values of copper surface also reduce in cryogenic systems heat load transferred by thermal radiation. These values may be, however, enhanced by a prospective coating, deposited usually in order to prevent chemical changes on highly reactive copper surface. This paper focuses on protective layers of Al2O3 with thicknesses up to 28 nm, deposited on polished copper. We measured total hemispherical emissivity at cryogenic temperatures before and after the coating process. Contribution of Al2O3 layer to original copper emissivity increased with rising temperature of the layer and with the layer thickness. However, emissivity of the coated copper stayed below 2%, allowing usage of the coated copper in systems where low heat load by thermal radiation is needed. Preliminary tests with oxygen plasma shows that deposited layers can effectively protect the copper surface against oxidation and maintain the original thermal-radiative properties.
Klasifikace
Druh
D - Stať ve sborníku
CEP obor
—
OECD FORD obor
20303 - Thermodynamics
Návaznosti výsledku
Projekt
Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2021
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název statě ve sborníku
Cryogenics 2021 online. The 16th Cryogenics 2021 IIR International Conference, October 5-7, 2021. Proceedings
ISBN
978-2-36215-047-0
ISSN
0151-1637
e-ISSN
—
Počet stran výsledku
6
Strana od-do
113-118
Název nakladatele
ICCEX
Místo vydání
Praha
Místo konání akce
online
Datum konání akce
5. 10. 2021
Typ akce podle státní příslušnosti
WRD - Celosvětová akce
Kód UT WoS článku
—