Měření SXRD na GaSb(001) rekonstrukce

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F08%3A00319880" target="_blank" >RIV/68378271:_____/08:00319880 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

GaSb(001) surface reconstructions measured at the growth front by furface X-ray diffraction

Popis výsledku v původním jazyce

Surface x-ray diffraction was employed, in situ, to measure the GaSb(001)-(1 x 5) and (1 x 3) surface phases under technologically relevant growth conditions. We measured a large set of fractional-order in-plane diffraction peaks arising from the superstructure of the surface reconstruction. From the data we calculated two-dimensional (2D) Patterson functions. For the (1 x 3) phase we obtained good agreement between our data and the ?(4 x 3) model proposed in recent experimental and theoretical work. Our measurements on the Sb-rich (1 x 5) phase provide evidence that the structure under growth conditions is, in fact, different from that of the models previously suggested on the basis of scanning tunneling microscopy (STM). We discuss reasons for this discrepancy as well as the identified structural elements for these reconstructions, which include surface relaxations and subsurface rearrangement.

Název v anglickém jazyce

GaSb(001) surface reconstructions measured at the growth front by furface X-ray diffraction

Popis výsledku anglicky

Surface x-ray diffraction was employed, in situ, to measure the GaSb(001)-(1 x 5) and (1 x 3) surface phases under technologically relevant growth conditions. We measured a large set of fractional-order in-plane diffraction peaks arising from the superstructure of the surface reconstruction. From the data we calculated two-dimensional (2D) Patterson functions. For the (1 x 3) phase we obtained good agreement between our data and the ?(4 x 3) model proposed in recent experimental and theoretical work. Our measurements on the Sb-rich (1 x 5) phase provide evidence that the structure under growth conditions is, in fact, different from that of the models previously suggested on the basis of scanning tunneling microscopy (STM). We discuss reasons for this discrepancy as well as the identified structural elements for these reconstructions, which include surface relaxations and subsurface rearrangement.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2008

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Electronic Materials

ISSN

0361-5235

e-ISSN

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Svazek periodika

37

Číslo periodika v rámci svazku

12

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

6

Strana od-do

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Kód UT WoS článku

000260377400008

EID výsledku v databázi Scopus

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