Synchrotron topographic evaluation of strain around craters generated by irradiation with X-ray pulses from free electron laser with different intensities

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F15%3A00487218" target="_blank" >RIV/68378271:_____/15:00487218 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.nimb.2015.07.115" target="_blank" >http://dx.doi.org/10.1016/j.nimb.2015.07.115</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.nimb.2015.07.115" target="_blank" >10.1016/j.nimb.2015.07.115</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Synchrotron topographic evaluation of strain around craters generated by irradiation with X-ray pulses from free electron laser with different intensities

Popis výsledku v původním jazyce

The silicon sample irradiated with femtosecond soft X-ray pulses has been studied with several synchrotron X-ray diffraction topographic methods at HASYLAB. The topographic investigation revealed characteristic images of the created craters included the inner region reflecting the X-rays at lower angle, coming most probably from part of the silicon melted during the irradiation. The melted region was surrounded by strained outer region, similar to those observed in the case of rod-like inclusion but less regular in view of some irregularity of the beam used for generation of the craters. The higher dose resulted in increasing diameter of the melted area of the crater and the range of the strained region around it. Some features of the monochromatic and white beam back reflection section images of the craters were reproduced in numerically simulated images approximating the strain field in the crater by a droplet containing uniformly distributed point inclusions.n

Název v anglickém jazyce

Synchrotron topographic evaluation of strain around craters generated by irradiation with X-ray pulses from free electron laser with different intensities

Popis výsledku anglicky

The silicon sample irradiated with femtosecond soft X-ray pulses has been studied with several synchrotron X-ray diffraction topographic methods at HASYLAB. The topographic investigation revealed characteristic images of the created craters included the inner region reflecting the X-rays at lower angle, coming most probably from part of the silicon melted during the irradiation. The melted region was surrounded by strained outer region, similar to those observed in the case of rod-like inclusion but less regular in view of some irregularity of the beam used for generation of the craters. The higher dose resulted in increasing diameter of the melted area of the crater and the range of the strained region around it. Some features of the monochromatic and white beam back reflection section images of the craters were reproduced in numerically simulated images approximating the strain field in the crater by a droplet containing uniformly distributed point inclusions.n

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10305 - Fluids and plasma physics (including surface physics)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2015

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nuclear Instruments & Methods in Physics Research Section B

ISSN

0168-583X

e-ISSN

—

Svazek periodika

364

Číslo periodika v rámci svazku

Dec

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

7

Strana od-do

20-26

Kód UT WoS článku

000366617700004

EID výsledku v databázi Scopus

2-s2.0-85028198723