Physical properties investigation of reduced graphene oxide thin films prepared by material inkjet printing

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F17%3A00482370" target="_blank" >RIV/68378271:_____/17:00482370 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216305:26310/17:PU124331

Výsledek na webu

<a href="http://dx.doi.org/10.1155/2017/3501903" target="_blank" >http://dx.doi.org/10.1155/2017/3501903</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1155/2017/3501903" target="_blank" >10.1155/2017/3501903</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Physical properties investigation of reduced graphene oxide thin films prepared by material inkjet printing

Popis výsledku v původním jazyce

The article is focused on the study of the optical properties of inkjet-printed graphene oxide (GO) layers by spectroscopic ellipsometry. Due to its unique optical and electrical properties, GO can be used as, for example, a transparent and flexible electrode material in organic and printed electronics. Spectroscopic ellipsometry was used to characterize the optical response of the GO layer and its reduced form (rGO, obtainable, for example, by reduction of prepared layers by either annealing, UV radiation, or chemical reduction) in the visible range. The thicknesses of the layers were determined by a mechanical profilometer and used as an input parameter for optical modeling. Ellipsometric spectra were analyzed according to the dispersion model and the influence of the reduction of GO on optical constants is discussed.n

Název v anglickém jazyce

Physical properties investigation of reduced graphene oxide thin films prepared by material inkjet printing

Popis výsledku anglicky

The article is focused on the study of the optical properties of inkjet-printed graphene oxide (GO) layers by spectroscopic ellipsometry. Due to its unique optical and electrical properties, GO can be used as, for example, a transparent and flexible electrode material in organic and printed electronics. Spectroscopic ellipsometry was used to characterize the optical response of the GO layer and its reduced form (rGO, obtainable, for example, by reduction of prepared layers by either annealing, UV radiation, or chemical reduction) in the visible range. The thicknesses of the layers were determined by a mechanical profilometer and used as an input parameter for optical modeling. Ellipsometric spectra were analyzed according to the dispersion model and the influence of the reduction of GO on optical constants is discussed.n

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Nanomaterials

ISSN

1687-4110

e-ISSN

—

Svazek periodika

2017

Číslo periodika v rámci svazku

Aug

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

—

Kód UT WoS článku

000409224800001

EID výsledku v databázi Scopus

2-s2.0-85029214261