Electrical resistivity anomaly, valence shift of Pr ion, and magnetic behavior in epitaxial (Pr1-yYy)1-xCaxCoO3 thin films under compressive strain

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F17%3A00485352" target="_blank" >RIV/68378271:_____/17:00485352 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1063/1.4978747" target="_blank" >http://dx.doi.org/10.1063/1.4978747</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.4978747" target="_blank" >10.1063/1.4978747</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Electrical resistivity anomaly, valence shift of Pr ion, and magnetic behavior in epitaxial (Pr1-yYy)1-xCaxCoO3 thin films under compressive strain

Popis výsledku v původním jazyce

We have fabricated (Pr1-yYy)1-xCaxCoO3 (PYCCO) epitaxial films with various thicknesses by pulsed laser deposition on the SrLaAlO4 (SLAO) substrate that applied an in-plane compressive stress to the film, and investigated the temperature dependence of the electrical resistivity, ρ(T), of the films. An anomalous ρ(T) upturn with a broad hysteresis could be clearly observed only for the thinnest film (d = 50 nm), and the ρ(T) anomaly decreased by increasing film thickness, d. The temperature dependence of the X-ray absorption near-edge structure (XANES) spectra at Pr L2-edge was measured for the films, and the valence states of praseodymium (Pr) ion were determined using the analysis of the XANES spectra. As a result, the average valence of the Pr ion in the d = 50 nm film slightly increases with decreasing temperature from the common value of 3.0+ around room temperature to 3.15+ at 8 K.

Název v anglickém jazyce

Electrical resistivity anomaly, valence shift of Pr ion, and magnetic behavior in epitaxial (Pr1-yYy)1-xCaxCoO3 thin films under compressive strain

Popis výsledku anglicky

We have fabricated (Pr1-yYy)1-xCaxCoO3 (PYCCO) epitaxial films with various thicknesses by pulsed laser deposition on the SrLaAlO4 (SLAO) substrate that applied an in-plane compressive stress to the film, and investigated the temperature dependence of the electrical resistivity, ρ(T), of the films. An anomalous ρ(T) upturn with a broad hysteresis could be clearly observed only for the thinnest film (d = 50 nm), and the ρ(T) anomaly decreased by increasing film thickness, d. The temperature dependence of the X-ray absorption near-edge structure (XANES) spectra at Pr L2-edge was measured for the films, and the valence states of praseodymium (Pr) ion were determined using the analysis of the XANES spectra. As a result, the average valence of the Pr ion in the d = 50 nm film slightly increases with decreasing temperature from the common value of 3.0+ around room temperature to 3.15+ at 8 K.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

<a href="/cs/project/GA17-04412S" target="_blank" >GA17-04412S: Transport náboje a fázové přechody v oxidech kobaltu studované s využitím terahertzové spektroskopie</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Applied Physics

ISSN

0021-8979

e-ISSN

—

Svazek periodika

121

Číslo periodika v rámci svazku

11

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

—

Kód UT WoS článku

000397421400039

EID výsledku v databázi Scopus

2-s2.0-85016138267