Effect of gamma radiation on thermostimulated exoelectron emission from Gd2O3 films

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F20%3A00535244" target="_blank" >RIV/68378271:_____/20:00535244 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1016/j.nimb.2019.11.016" target="_blank" >https://doi.org/10.1016/j.nimb.2019.11.016</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.nimb.2019.11.016" target="_blank" >10.1016/j.nimb.2019.11.016</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Effect of gamma radiation on thermostimulated exoelectron emission from Gd2O3 films

Popis výsledku v původním jazyce

The effect of gamma irradiation on Gd2O3 films was studied using the thermostimulated exoelectron emission (TSEE) technique. The films were deposited on a glass and Si/SiO2 substrates using an extraction-pyrolytic method. Crystalline structure, chemical composition, film thickness and surface morphology were characterized by means of X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The films were irradiated by 10 MeV gamma photons and TSEE was measured from the irradiated films. It was found that gamma irradiation decreases TSEE intensity and the area below TSEE spectral curves. A linear correlation between the relative decrease in the area and the delivered dose was observed in a dose range of 0–10 Gy. These findings suggest that gamma radiation might decrease the density of trapped electrons present in the as-grown Gd2O3 films or create competing electron traps that inhibit TSEE from the films.

Název v anglickém jazyce

Effect of gamma radiation on thermostimulated exoelectron emission from Gd2O3 films

Popis výsledku anglicky

The effect of gamma irradiation on Gd2O3 films was studied using the thermostimulated exoelectron emission (TSEE) technique. The films were deposited on a glass and Si/SiO2 substrates using an extraction-pyrolytic method. Crystalline structure, chemical composition, film thickness and surface morphology were characterized by means of X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The films were irradiated by 10 MeV gamma photons and TSEE was measured from the irradiated films. It was found that gamma irradiation decreases TSEE intensity and the area below TSEE spectral curves. A linear correlation between the relative decrease in the area and the delivered dose was observed in a dose range of 0–10 Gy. These findings suggest that gamma radiation might decrease the density of trapped electrons present in the as-grown Gd2O3 films or create competing electron traps that inhibit TSEE from the films.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10403 - Physical chemistry

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nuclear Instruments & Methods in Physics Research Section B

ISSN

0168-583X

e-ISSN

—

Svazek periodika

463

Číslo periodika v rámci svazku

Jan

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

6

Strana od-do

21-26

Kód UT WoS článku

000518699900004

EID výsledku v databázi Scopus

2-s2.0-85075478921