Combined depth-resolved cathodoluminescence spectroscopy and transmission electron microscopy on Al(Ga)N multi quantum well structures

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F21%3A00543407" target="_blank" >RIV/68378271:_____/21:00543407 - isvavai.cz</a>

Výsledek na webu

<a href="http://hdl.handle.net/11104/0320622" target="_blank" >http://hdl.handle.net/11104/0320622</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/2632-959X/abdad9" target="_blank" >10.1088/2632-959X/abdad9</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Combined depth-resolved cathodoluminescence spectroscopy and transmission electron microscopy on Al(Ga)N multi quantum well structures

Popis výsledku v původním jazyce

A stack of five Al(Ga)N-based quantum wells is investigated by combined laterally and depth resolved cathodoluminescence (CL) spectroscopy in order to distinguish lateral and vertical inhomogeneities of these wells. Transmission electron microscopy (TEM) micrographs provide data for the real sample structure, which enters into the Monte-Carlo simulation of the depth-resolved CL measurements to refine the depth resolution. The comparison of these CL measurements to the results of electron energy loss spectra (EELS) allows to identify local thickness variations of the lower three quantum wells to be the origin of two different luminescence contributions to the overall spectrum. The differentiation of the two groups of quantum wells by depth-resolved CL is demonstrated.

Název v anglickém jazyce

Combined depth-resolved cathodoluminescence spectroscopy and transmission electron microscopy on Al(Ga)N multi quantum well structures

Popis výsledku anglicky

A stack of five Al(Ga)N-based quantum wells is investigated by combined laterally and depth resolved cathodoluminescence (CL) spectroscopy in order to distinguish lateral and vertical inhomogeneities of these wells. Transmission electron microscopy (TEM) micrographs provide data for the real sample structure, which enters into the Monte-Carlo simulation of the depth-resolved CL measurements to refine the depth resolution. The comparison of these CL measurements to the results of electron energy loss spectra (EELS) allows to identify local thickness variations of the lower three quantum wells to be the origin of two different luminescence contributions to the overall spectrum. The differentiation of the two groups of quantum wells by depth-resolved CL is demonstrated.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

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OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

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Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2021

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nano Express

ISSN

2632-959X

e-ISSN

2632-959X

Svazek periodika

2

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

14

Strana od-do

014002

Kód UT WoS článku

000658971700001

EID výsledku v databázi Scopus

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