Damage kinetics induced by swift heavy ion impacts onto films of different thicknesses

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F21%3A00545325" target="_blank" >RIV/68378271:_____/21:00545325 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61389021:_____/21:00579879

Výsledek na webu

<a href="https://doi.org/10.1016/j.apsusc.2021.150640" target="_blank" >https://doi.org/10.1016/j.apsusc.2021.150640</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.apsusc.2021.150640" target="_blank" >10.1016/j.apsusc.2021.150640</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Damage kinetics induced by swift heavy ion impacts onto films of different thicknesses

Popis výsledku v původním jazyce

Response of CaF2 thin films to swift heavy ions irradiation is studied with Monte-Carlo code TREKIS and mo lecular dynamics simulations. Two factors affecting the damage kinetics in ion tracks in films of different thickness are considered: electron emission and an effect of the layer thickness. It is shown that escape of electrons from the target surface is important in films thinner than 15 nm and can significantly reduce energy deposited into the lattice. Three different modes of damage realize depending on the layer thickness: a through hole forms in the thinnest layers despite energy loss via electron emission, semispherical and spherical hillocks form at intermediate thicknesses, emission of nanoclusters occurs from thick layers.

Název v anglickém jazyce

Damage kinetics induced by swift heavy ion impacts onto films of different thicknesses

Popis výsledku anglicky

Response of CaF2 thin films to swift heavy ions irradiation is studied with Monte-Carlo code TREKIS and mo lecular dynamics simulations. Two factors affecting the damage kinetics in ion tracks in films of different thickness are considered: electron emission and an effect of the layer thickness. It is shown that escape of electrons from the target surface is important in films thinner than 15 nm and can significantly reduce energy deposited into the lattice. Three different modes of damage realize depending on the layer thickness: a through hole forms in the thinnest layers despite energy loss via electron emission, semispherical and spherical hillocks form at intermediate thicknesses, emission of nanoclusters occurs from thick layers.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10301 - Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2021

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Applied Surface Science

ISSN

0169-4332

e-ISSN

1873-5584

Svazek periodika

566

Číslo periodika v rámci svazku

Nov

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

10

Strana od-do

150640

Kód UT WoS článku

000691203700007

EID výsledku v databázi Scopus

2-s2.0-85111316001