Real and imaginary permittivity measured by thermal noise dielectric spectroscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F22%3A00559990" target="_blank" >RIV/68378271:_____/22:00559990 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1063/5.0084805" target="_blank" >https://doi.org/10.1063/5.0084805</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/5.0084805" target="_blank" >10.1063/5.0084805</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Real and imaginary permittivity measured by thermal noise dielectric spectroscopy

Popis výsledku v původním jazyce

This paper demonstrates that both real and imaginary parts of dielectric permittivity in a kHz frequency range can be determined from the thermal noise voltage spectra. The proposed method, termed as thermal noise dielectric spectroscopy, relies on the set of calibration measurements of gauge resistors and capacitors. This method has a great potential for investigations of strongly nonlinear dielectric materials whenever the initial permittivity is of interest because the thermal noise method probes the permittivity by an almost zero electric field. Here, we tested this method by measuring dielectric spectra of 100 nm thin film of paraelectric SrTiO3 in a thermal noise setup in which the film is effectively probed by voltages of the order of nanovolts. For the sake of comparison, the permittivity of the same SrTiO3 thin film has been also measured using the standard impedance analyzer with the probing AC voltage of 10 mV.

Název v anglickém jazyce

Real and imaginary permittivity measured by thermal noise dielectric spectroscopy

Popis výsledku anglicky

This paper demonstrates that both real and imaginary parts of dielectric permittivity in a kHz frequency range can be determined from the thermal noise voltage spectra. The proposed method, termed as thermal noise dielectric spectroscopy, relies on the set of calibration measurements of gauge resistors and capacitors. This method has a great potential for investigations of strongly nonlinear dielectric materials whenever the initial permittivity is of interest because the thermal noise method probes the permittivity by an almost zero electric field. Here, we tested this method by measuring dielectric spectra of 100 nm thin film of paraelectric SrTiO3 in a thermal noise setup in which the film is effectively probed by voltages of the order of nanovolts. For the sake of comparison, the permittivity of the same SrTiO3 thin film has been also measured using the standard impedance analyzer with the probing AC voltage of 10 mV.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2022

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Applied Physics

ISSN

0021-8979

e-ISSN

1089-7550

Svazek periodika

131

Číslo periodika v rámci svazku

21

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

6

Strana od-do

214101

Kód UT WoS článku

000850284100001

EID výsledku v databázi Scopus

2-s2.0-85131335496