Influence of Change of Imaging Conditions on Accuracy of Optical Measurement Systems

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21110%2F03%3A01088350" target="_blank" >RIV/68407700:21110/03:01088350 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

Influence of Change of Imaging Conditions on Accuracy of Optical Measurement Systems

Popis výsledku v původním jazyce

The work analyses an influence of the change of imaging conditions on the accuracy of optical and optoelectronic measurement systems, which are used in various industrial branches, e.g. in mechanical engineering, optical industry, building industry, etc.It is shown that in case of the change of position of the measured object the imaging properties of the used optical measurement instrument are changed. This position change affects the image quality. If some optical measurement system is aberration free for a specified position of the measured object, then for other object positions the optical system has aberrations. The consequence of this effect is the change of the measurement accuracy for the specific optical system. The described effect is not removable on principle and it is necessary to take account to it in high accuracy measurements

Název v anglickém jazyce

Influence of Change of Imaging Conditions on Accuracy of Optical Measurement Systems

Popis výsledku anglicky

The work analyses an influence of the change of imaging conditions on the accuracy of optical and optoelectronic measurement systems, which are used in various industrial branches, e.g. in mechanical engineering, optical industry, building industry, etc.It is shown that in case of the change of position of the measured object the imaging properties of the used optical measurement instrument are changed. This position change affects the image quality. If some optical measurement system is aberration free for a specified position of the measured object, then for other object positions the optical system has aberrations. The consequence of this effect is the change of the measurement accuracy for the specific optical system. The described effect is not removable on principle and it is necessary to take account to it in high accuracy measurements

Druh

D - Stať ve sborníku

CEP obor

BH - Optika, masery a lasery

OECD FORD obor

—

Projekt

<a href="/cs/project/GA103%2F02%2F0357" target="_blank" >GA103/02/0357: Moderní optoelektronické metody topografie ploch</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2003

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

SPIE Proceedings, Vol. 5144

ISBN

0-8194-5014-6

ISSN

—

e-ISSN

—

Počet stran výsledku

5

Strana od-do

801-805

Název nakladatele

SPIE

Místo vydání

Washington

Místo konání akce

Munich

Datum konání akce

23. 6. 2003

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

—