Exponential Fit Test - Theoretical Analysis and Practically Implementation

Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F08%3A00146037" target="_blank" >RIV/68407700:21230/08:00146037 - isvavai.cz</a>
Výsledek na webu
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DOI - Digital Object Identifier
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Jazyk výsledku
angličtina
Název v původním jazyce
Exponential Fit Test - Theoretical Analysis and Practically Implementation
Popis výsledku v původním jazyce
ADC testing by means of exponential signal is presented in the article. Time and frequency analysis of the signal is performed and Signal-to-Noise Ratio and Effective Number of Bits is calculated by means of Best-Exponential Fit Test. The approach has been verified on 24-bit Flexible Resolution Digitizer PXI-5922 by National Instruments. Results comparable with classical sine-fit method indicate the possibility of consideration of the proposed method as an alternative digitizer test method.
Název v anglickém jazyce
Exponential Fit Test - Theoretical Analysis and Practically Implementation
Popis výsledku anglicky
ADC testing by means of exponential signal is presented in the article. Time and frequency analysis of the signal is performed and Signal-to-Noise Ratio and Effective Number of Bits is calculated by means of Best-Exponential Fit Test. The approach has been verified on 24-bit Flexible Resolution Digitizer PXI-5922 by National Instruments. Results comparable with classical sine-fit method indicate the possibility of consideration of the proposed method as an alternative digitizer test method.

Rok uplatnění
2008
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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