Universal Test Bench for Characterization of Distance-measuring and Strain Sensors

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F10%3A00171444" target="_blank" >RIV/68407700:21230/10:00171444 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Universal Test Bench for Characterization of Distance-measuring and Strain Sensors

Popis výsledku v původním jazyce

Following text describes a universal test bench that can be used for characterization of the sensors. It offers sufficient distance and force ability to characterize a wide sort of the sensors. It is suitable for precise distance setting. It is able to set the distance in the range of 10 cm with the resolution up to 10 ?m. The mechanical tolerance is negligible. It is less than five micrometers for unloaded viper. Possible relevant tolerance can be caused only by the structure frame bending when the high mechanical stress is applied. The test bench was developed as a research instrument for characterization of new sensor structures and it is also used as a teaching facilitation in the sensor systems tutorial. The test bench functionality is illustratedon five types of the sensors - the capacitive sensor, the optic sensor GP2D120, the Hall sensor A1301, the magneto resistive sensor HMC1501 and for the compression measurement was used the cantilever beam LC501-100.

Název v anglickém jazyce

Universal Test Bench for Characterization of Distance-measuring and Strain Sensors

Popis výsledku anglicky

Following text describes a universal test bench that can be used for characterization of the sensors. It offers sufficient distance and force ability to characterize a wide sort of the sensors. It is suitable for precise distance setting. It is able to set the distance in the range of 10 cm with the resolution up to 10 ?m. The mechanical tolerance is negligible. It is less than five micrometers for unloaded viper. Possible relevant tolerance can be caused only by the structure frame bending when the high mechanical stress is applied. The test bench was developed as a research instrument for characterization of new sensor structures and it is also used as a teaching facilitation in the sensor systems tutorial. The test bench functionality is illustratedon five types of the sensors - the capacitive sensor, the optic sensor GP2D120, the Hall sensor A1301, the magneto resistive sensor HMC1501 and for the compression measurement was used the cantilever beam LC501-100.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/GA102%2F09%2F1601" target="_blank" >GA102/09/1601: Inteligentní mikro a nano struktury pro mikrosenzory realizované s využitím nanotechnologií</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

ElectroScope

ISSN

1802-4564

e-ISSN

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Svazek periodika

2010

Číslo periodika v rámci svazku

3

Stát vydavatele periodika

CZ - Česká republika

Počet stran výsledku

6

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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