The estimation of test signal quality by means of two simple filters in ADC testing

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F12%3A00195316" target="_blank" >RIV/68407700:21230/12:00195316 - isvavai.cz</a>

Výsledek na webu

<a href="http://www.sciencedirect.com/science/article/pii/S0920548911000791" target="_blank" >http://www.sciencedirect.com/science/article/pii/S0920548911000791</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.csi.2011.06.005" target="_blank" >10.1016/j.csi.2011.06.005</a>

Jazyk výsledku

angličtina

Název v původním jazyce

The estimation of test signal quality by means of two simple filters in ADC testing

Popis výsledku v původním jazyce

Methods for ADC dynamic testing standardized in IEEE standards are primarily based on sampling sine wave test signal. Harmonic generator is recommended with the THD and the SNHR about 10 dB better than those of the tested ADC. However, this condition creates problems for testing state-of-the-art ADCs. This paper proposes an easy method for testing signal spectral purity. The test signal, which is passed by two simple analog filters, is measured by a common ADC, whose nonlinearity is post-corrected mathematically. The results are then compared with the common approach of applying a notch filter, and uncertainties of results are evaluated.

Název v anglickém jazyce

The estimation of test signal quality by means of two simple filters in ADC testing

Popis výsledku anglicky

Methods for ADC dynamic testing standardized in IEEE standards are primarily based on sampling sine wave test signal. Harmonic generator is recommended with the THD and the SNHR about 10 dB better than those of the tested ADC. However, this condition creates problems for testing state-of-the-art ADCs. This paper proposes an easy method for testing signal spectral purity. The test signal, which is passed by two simple analog filters, is measured by a common ADC, whose nonlinearity is post-corrected mathematically. The results are then compared with the common approach of applying a notch filter, and uncertainties of results are evaluated.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

—

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Computer Standards & Interfaces

ISSN

0920-5489

e-ISSN

—

Svazek periodika

34

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

6

Strana od-do

156-161

Kód UT WoS článku

000299147100017

EID výsledku v databázi Scopus

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