Precisely controlling the twist angle of epitaxial MoS2/graphene heterostructure by AFM tip manipulation

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F22%3A00360190" target="_blank" >RIV/68407700:21230/22:00360190 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1088/1674-1056/ac720e" target="_blank" >https://doi.org/10.1088/1674-1056/ac720e</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1674-1056/ac720e" target="_blank" >10.1088/1674-1056/ac720e</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Precisely controlling the twist angle of epitaxial MoS2/graphene heterostructure by AFM tip manipulation

Popis výsledku v původním jazyce

Two-dimensional (2D) moire materials have attracted a lot of attention and opened a new research frontier of twistronics due to their novel physical properties. Although great progress has been achieved, the inability to precisely and reproducibly manipulate the twist angle hinders the further development of twistronics. Here, we demonstrated an atomic force microscope (AFM) tip manipulation method to control the interlayer twist angle of epitaxial MoS2/graphene heterostructure with an ultra-high accuracy better than 0.1 degrees. Furthermore, conductive AFM and spectroscopic characterizations were conducted to show the effects of the twist angle on moire pattern wavelength, phonons and excitons. Our work provides a technique to precisely control the twist angle of 2D moire materials, enabling the possibility to establish the phase diagrams of moire physics with twist angle.

Název v anglickém jazyce

Precisely controlling the twist angle of epitaxial MoS2/graphene heterostructure by AFM tip manipulation

Popis výsledku anglicky

Two-dimensional (2D) moire materials have attracted a lot of attention and opened a new research frontier of twistronics due to their novel physical properties. Although great progress has been achieved, the inability to precisely and reproducibly manipulate the twist angle hinders the further development of twistronics. Here, we demonstrated an atomic force microscope (AFM) tip manipulation method to control the interlayer twist angle of epitaxial MoS2/graphene heterostructure with an ultra-high accuracy better than 0.1 degrees. Furthermore, conductive AFM and spectroscopic characterizations were conducted to show the effects of the twist angle on moire pattern wavelength, phonons and excitons. Our work provides a technique to precisely control the twist angle of 2D moire materials, enabling the possibility to establish the phase diagrams of moire physics with twist angle.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20505 - Composites (including laminates, reinforced plastics, cermets, combined natural and synthetic fibre fabrics; filled composites)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2022

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Chinese Physics B

ISSN

1674-1056

e-ISSN

2058-3834

Svazek periodika

31

Číslo periodika v rámci svazku

8

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

5

Strana od-do

—

Kód UT WoS článku

000828345900001

EID výsledku v databázi Scopus

2-s2.0-85135241732