High-speed Equivalent-time Sampling Virtual Instrument Based on Microcontroller ADC

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F23%3A00367114" target="_blank" >RIV/68407700:21230/23:00367114 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1016/j.measurement.2023.113392" target="_blank" >https://doi.org/10.1016/j.measurement.2023.113392</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.measurement.2023.113392" target="_blank" >10.1016/j.measurement.2023.113392</a>

Jazyk výsledku

angličtina

Název v původním jazyce

High-speed Equivalent-time Sampling Virtual Instrument Based on Microcontroller ADC

Popis výsledku v původním jazyce

The paper describes the utilization of high-speed Equivalent-Time Sampling (ETS) in Software-Defined Instruments used for virtual instrumentation - typically oscilloscopes. With the increasing performance and expansion of peripherals of microcontrollers (MCU), it is possible to realize measuring instruments only with MCU itself. A solution to MCUs' Analog-to-Digital Converter (ADC) maximal sampling frequency limitations in digitizing quick transient responses is presented. The principle of ETS with all derived equations is discussed and explained, as well as the ADC input model and real properties of software-defined oscilloscope from an ETS point of view. All the ideas are practically verified on different MCUs (Raspberry PI PICO, STM32, Arduino). The use of ETS for circuit behavior analysis where an MCU with internal peripherals (generator with pulse-width modulation and ADC) is used for a test signal generation and data digitization may increase the equivalent sampling rate of the internal ADC up to tens of MSa/s.

Název v anglickém jazyce

High-speed Equivalent-time Sampling Virtual Instrument Based on Microcontroller ADC

Popis výsledku anglicky

The paper describes the utilization of high-speed Equivalent-Time Sampling (ETS) in Software-Defined Instruments used for virtual instrumentation - typically oscilloscopes. With the increasing performance and expansion of peripherals of microcontrollers (MCU), it is possible to realize measuring instruments only with MCU itself. A solution to MCUs' Analog-to-Digital Converter (ADC) maximal sampling frequency limitations in digitizing quick transient responses is presented. The principle of ETS with all derived equations is discussed and explained, as well as the ADC input model and real properties of software-defined oscilloscope from an ETS point of view. All the ideas are practically verified on different MCUs (Raspberry PI PICO, STM32, Arduino). The use of ETS for circuit behavior analysis where an MCU with internal peripherals (generator with pulse-width modulation and ADC) is used for a test signal generation and data digitization may increase the equivalent sampling rate of the internal ADC up to tens of MSa/s.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

—

Návaznosti

N - Vyzkumna aktivita podporovana z neverejnych zdroju

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Measurement

ISSN

0263-2241

e-ISSN

1873-412X

Svazek periodika

220

Číslo periodika v rámci svazku

220

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

10

Strana od-do

1-10

Kód UT WoS článku

001055022900001

EID výsledku v databázi Scopus

2-s2.0-85169900781