Input Currents of CMOS SAR ADC in Microcontroller, their Measurement and Behavior Model from Users Point of View
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F24%3A00375579" target="_blank" >RIV/68407700:21230/24:00375579 - isvavai.cz</a>
Výsledek na webu
<a href="http://hdl.handle.net/10467/121990" target="_blank" >http://hdl.handle.net/10467/121990</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.measurement.2024.115143" target="_blank" >10.1016/j.measurement.2024.115143</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Input Currents of CMOS SAR ADC in Microcontroller, their Measurement and Behavior Model from Users Point of View
Popis výsledku v původním jazyce
The article introduces possible issue of internal CMOS SAR microcontroller's ADC input currents. It describes a nature of the ADC input current and its dependence on a sampling frequency. Methods for measurement of parameters such as input charge, residual voltage, and equivalent capacitance of sample-hold circuits are presented and used in the proposed simplified model of ADC input behavior. These parameters, which are not listed in datasheets, if not respected in data acquisition designs, can adversely affect how the ADC is used when measuring signal sources with nonnegligible internal resistance. The article also explains how to solve a voltage measurement on a source with high internal resistance even in a situation where, according to datasheets, it should already have limitations. The proposed simplified CMOS SAR ADC input behavior model in an MCU can help users in MCU-based data acquisition system design.
Název v anglickém jazyce
Input Currents of CMOS SAR ADC in Microcontroller, their Measurement and Behavior Model from Users Point of View
Popis výsledku anglicky
The article introduces possible issue of internal CMOS SAR microcontroller's ADC input currents. It describes a nature of the ADC input current and its dependence on a sampling frequency. Methods for measurement of parameters such as input charge, residual voltage, and equivalent capacitance of sample-hold circuits are presented and used in the proposed simplified model of ADC input behavior. These parameters, which are not listed in datasheets, if not respected in data acquisition designs, can adversely affect how the ADC is used when measuring signal sources with nonnegligible internal resistance. The article also explains how to solve a voltage measurement on a source with high internal resistance even in a situation where, according to datasheets, it should already have limitations. The proposed simplified CMOS SAR ADC input behavior model in an MCU can help users in MCU-based data acquisition system design.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
20201 - Electrical and electronic engineering
Návaznosti výsledku
Projekt
—
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2024
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Measurement
ISSN
0263-2241
e-ISSN
1873-412X
Svazek periodika
236
Číslo periodika v rámci svazku
236
Stát vydavatele periodika
US - Spojené státy americké
Počet stran výsledku
10
Strana od-do
1-10
Kód UT WoS článku
001332471400001
EID výsledku v databázi Scopus
2-s2.0-85196557252