Fault Models Usability Study for On-line Tested FPGA

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F11%3A00182599" target="_blank" >RIV/68407700:21240/11:00182599 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Fault Models Usability Study for On-line Tested FPGA

Popis výsledku v původním jazyce

FPGAs are susceptible to many environment effects that can cause soft errors (errors which can be corrected by the reconfiguration ability of the FPGA). Two different fault models are discussed and compared in this paper. The first one - Stuck-at model -is widely used in many applications and it is not limited to the FPGAs. The second one - Bit-flip model - can affect SRAM cells that are used to configure the internal routing of the FPGA and to set up the behavior of the Look-Up Tables (LUTs). The change of the LUT behavior is the only Bit-flip effect considered in this paper. A fault model analysis has been performed on small example designs in order to find the differences between the fault models. This paper discusses the relevance of using two types of models Stuck-at and Bit-flip with respect to the dependability characteristics Fault Security (FS) and Self-Testing (ST). The fault simulation using both fault models has been performed to verify the analysis

Název v anglickém jazyce

Fault Models Usability Study for On-line Tested FPGA

Popis výsledku anglicky

FPGAs are susceptible to many environment effects that can cause soft errors (errors which can be corrected by the reconfiguration ability of the FPGA). Two different fault models are discussed and compared in this paper. The first one - Stuck-at model -is widely used in many applications and it is not limited to the FPGAs. The second one - Bit-flip model - can affect SRAM cells that are used to configure the internal routing of the FPGA and to set up the behavior of the Look-Up Tables (LUTs). The change of the LUT behavior is the only Bit-flip effect considered in this paper. A fault model analysis has been performed on small example designs in order to find the differences between the fault models. This paper discusses the relevance of using two types of models Stuck-at and Bit-flip with respect to the dependability characteristics Fault Security (FS) and Self-Testing (ST). The fault simulation using both fault models has been performed to verify the analysis

Druh

D - Stať ve sborníku

CEP obor

JC - Počítačový hardware a software

OECD FORD obor

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Projekt

<a href="/cs/project/GA102%2F09%2F1668" target="_blank" >GA102/09/1668: Zvyšování spolehlivosti a provozuschopnosti v obvodech SoC</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of the 14th Euromicro Conference on Digital System Design

ISBN

978-0-7695-4494-6

ISSN

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e-ISSN

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Počet stran výsledku

4

Strana od-do

287-290

Název nakladatele

IEEE Computer Society Press

Místo vydání

Los Alamitos

Místo konání akce

Oulu

Datum konání akce

31. 8. 2011

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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