Implicit Techniques for Constrained Test Patterns Generation

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F11%3A00183462" target="_blank" >RIV/68407700:21240/11:00183462 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Implicit Techniques for Constrained Test Patterns Generation

Popis výsledku v původním jazyce

Current test generation processes still have a room for improvement. One important factor is the representation of test patterns sets that a tool uses internally. This paper presents a brief overview of our research on implicit representations of test patterns set for constrained test patterns generation (CTPG). The SAT-Compress algorithm which is a simple modification of a general SAT-based ATPG (Automatic TPG) has been proposed. The set of all test patterns for a fault is represented implicitly as Boolean formula satisfiability problem in the CNF (Conjunctive Normal Form). Test patterns are compressed by overlapping. Previous experiments proved that on average 80% of the test generation time is spent on CNF generation. We have found that on average 98% of CNFs solved during CTPG process (SAT-Compress) is unsatisfiable with given constraints. These filters can detect on average 50% of UNSAT instance and accelerate the SAT-Compress more than two times.

Název v anglickém jazyce

Implicit Techniques for Constrained Test Patterns Generation

Popis výsledku anglicky

Current test generation processes still have a room for improvement. One important factor is the representation of test patterns sets that a tool uses internally. This paper presents a brief overview of our research on implicit representations of test patterns set for constrained test patterns generation (CTPG). The SAT-Compress algorithm which is a simple modification of a general SAT-based ATPG (Automatic TPG) has been proposed. The set of all test patterns for a fault is represented implicitly as Boolean formula satisfiability problem in the CNF (Conjunctive Normal Form). Test patterns are compressed by overlapping. Previous experiments proved that on average 80% of the test generation time is spent on CNF generation. We have found that on average 98% of CNFs solved during CTPG process (SAT-Compress) is unsatisfiable with given constraints. These filters can detect on average 50% of UNSAT instance and accelerate the SAT-Compress more than two times.

Druh

D - Stať ve sborníku

CEP obor

JC - Počítačový hardware a software

OECD FORD obor

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Projekt

<a href="/cs/project/GA102%2F09%2F1668" target="_blank" >GA102/09/1668: Zvyšování spolehlivosti a provozuschopnosti v obvodech SoC</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceeding of the 7th Doctoral Workshop on Mathematical and Engineering Methods in Computer Science

ISBN

978-80-214-4305-1

ISSN

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e-ISSN

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Počet stran výsledku

1

Strana od-do

106

Název nakladatele

Brno University of Technology

Místo vydání

Brno

Místo konání akce

Lednice

Datum konání akce

14. 10. 2011

Typ akce podle státní příslušnosti

CST - Celostátní akce

Kód UT WoS článku

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