Parity driven reconfigurable duplex system

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F17%3A00313345" target="_blank" >RIV/68407700:21240/17:00313345 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.micpro.2017.06.015" target="_blank" >http://dx.doi.org/10.1016/j.micpro.2017.06.015</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.micpro.2017.06.015" target="_blank" >10.1016/j.micpro.2017.06.015</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Parity driven reconfigurable duplex system

Popis výsledku v původním jazyce

This paper proposes a method improving the fault-coverage capabilities of Field Programmable Gate Array (FPGA) designs. Faults are mostly Single Event Upsets (SEUs) in the configuration memory of SRAM-based FPGAs and they can change the functionality of an implemented design. These changes may lead to crucial mistakes and cause damage to people and environment. The proposed method utilizes Concurrent Error Detection techniques and the basic architectures of actual modern FPGAs - the Look-Up Table (LUT) with two outputs. The main part of the paper is the description of the proposed method (Parity Waterfall) based on a cascade - waterfall - of several waves of inner parity generating the final parity of outputs of the whole circuit. The proposed Parity Waterfall (PWtf) method utilizes the (mostly) unused output of a two-output LUT to cover any single possible routing or LUT fault with a small area overhead. The encapsulation of the proposed PWtf method into a Duplication with Comparison scheme is presented in the second part of the paper. This encapsulation allows us to create a system containing two independent copies of all parts able to detect and localize any single fault (like common Triple Modular Redundancy method). Experiments are performed on the standard set of IWLS2005 benchmarks in our simulator. The results demonstrate differences between our proposed method and a similar existing technique - Duplication with Comparison (DwC), and between the encapsulated PWtf method and TMR. The proposed method has a lower relative overhead and requires a lower number of inputs and outputs.

Název v anglickém jazyce

Parity driven reconfigurable duplex system

Popis výsledku anglicky

This paper proposes a method improving the fault-coverage capabilities of Field Programmable Gate Array (FPGA) designs. Faults are mostly Single Event Upsets (SEUs) in the configuration memory of SRAM-based FPGAs and they can change the functionality of an implemented design. These changes may lead to crucial mistakes and cause damage to people and environment. The proposed method utilizes Concurrent Error Detection techniques and the basic architectures of actual modern FPGAs - the Look-Up Table (LUT) with two outputs. The main part of the paper is the description of the proposed method (Parity Waterfall) based on a cascade - waterfall - of several waves of inner parity generating the final parity of outputs of the whole circuit. The proposed Parity Waterfall (PWtf) method utilizes the (mostly) unused output of a two-output LUT to cover any single possible routing or LUT fault with a small area overhead. The encapsulation of the proposed PWtf method into a Duplication with Comparison scheme is presented in the second part of the paper. This encapsulation allows us to create a system containing two independent copies of all parts able to detect and localize any single fault (like common Triple Modular Redundancy method). Experiments are performed on the standard set of IWLS2005 benchmarks in our simulator. The results demonstrate differences between our proposed method and a similar existing technique - Duplication with Comparison (DwC), and between the encapsulated PWtf method and TMR. The proposed method has a lower relative overhead and requires a lower number of inputs and outputs.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20206 - Computer hardware and architecture

Projekt

<a href="/cs/project/GA16-05179S" target="_blank" >GA16-05179S: Výzkum vztahů a společných vlastností spolehlivých a bezpečných architektur založených na programovatelných obvodech</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Microprocessors and Microsystems

ISSN

0141-9331

e-ISSN

1872-9436

Svazek periodika

52

Číslo periodika v rámci svazku

July

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

10

Strana od-do

251-260

Kód UT WoS článku

000407984000021

EID výsledku v databázi Scopus

2-s2.0-85021187832