X-ray fluorescence as a non-destructive tool in investigation of Czech fine and applied art objects

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F15%3A00240551" target="_blank" >RIV/68407700:21340/15:00240551 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

X-ray fluorescence as a non-destructive tool in investigation of Czech fine and applied art objects

Popis výsledku v původním jazyce

The paper gives a brief review of possibilities of X-ray fluorescence analysis (XRFA) for investigations in the field of fine and applied arts. XRFA is an excellent tool for such investigations, being a non-destructive and non-invasive method, which can be applied both in a laboratory and in-situ. Its detection threshold for most elements of the periodic system (except the very light elements) is satisfactory for many purposes and materials. On the other hand, it has also some limitations. First of all, it is, strictly speaking, a surface layer analysing method, the depth of this layer depending on energy of both exciting and excited radiation (and, therefore, it depends also on the element, which is detected). And secondly, it is a method sensitive to the content of elements, not to compounds. Therefore, it is often advantageous to use it together with other analytical methods, e.g., Raman spectroscopy. An extensive general review of possibilities of XRFA in the field of cultural heritage was given.

Název v anglickém jazyce

X-ray fluorescence as a non-destructive tool in investigation of Czech fine and applied art objects

Popis výsledku anglicky

The paper gives a brief review of possibilities of X-ray fluorescence analysis (XRFA) for investigations in the field of fine and applied arts. XRFA is an excellent tool for such investigations, being a non-destructive and non-invasive method, which can be applied both in a laboratory and in-situ. Its detection threshold for most elements of the periodic system (except the very light elements) is satisfactory for many purposes and materials. On the other hand, it has also some limitations. First of all, it is, strictly speaking, a surface layer analysing method, the depth of this layer depending on energy of both exciting and excited radiation (and, therefore, it depends also on the element, which is detected). And secondly, it is a method sensitive to the content of elements, not to compounds. Therefore, it is often advantageous to use it together with other analytical methods, e.g., Raman spectroscopy. An extensive general review of possibilities of XRFA in the field of cultural heritage was given.

Druh

O - Ostatní výsledky

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

—

Projekt

<a href="/cs/project/DF12P01OVV034" target="_blank" >DF12P01OVV034: Průzkum sbírkových předmětů z fondů NTM moderními fyzikálními a chemickými metodami s cílem zkvalitnit jejich restaurování a preventivní konzervaci.</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2015

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů