Theoretical study of depth profiling with gamma- and x-ray spectrometry based on measurements of intensity ratios

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F16%3A00300130" target="_blank" >RIV/68407700:21340/16:00300130 - isvavai.cz</a>

Výsledek na webu

<a href="http://www.surrey.ac.uk/physics/news/events/icda-2/programme/24-June-2016-2nd%20International%20Conference%20on%20Dosimetry%20and%20its%20Applications.pdf" target="_blank" >http://www.surrey.ac.uk/physics/news/events/icda-2/programme/24-June-2016-2nd%20International%20Conference%20on%20Dosimetry%20and%20its%20Applications.pdf</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Theoretical study of depth profiling with gamma- and x-ray spectrometry based on measurements of intensity ratios

Popis výsledku v původním jazyce

The gamma- and x-ray spectrometry is a powerful tool for analysis of materials. Gamma spectrometry (GS) is used to identification and quantification of radionuclides, whereas the stimulated emission of x-ray radiation is applied to elemental analysis with an x-ray fluorescence method (XRF). Samples for laboratory GS and destructive XRF are usually homogenized before the analysis. However, the homogeneous composition is not ensured in the case of in-situ GS or non-destructive XRF. The principle of the proposed techniques lay in the different attenuation coefficients for at least two x-ray or gamma-ray lines of a certain element or radionuclide, respectively. If an analyte is present at some depth, its radiation has to penetrate through thick layer of the matrix, and the photon fluxes are significantly changed. For instance, 214Bi is a member of the uranium series and in present in soil or walls of building. Two gamma lines of this radionuclide can be detected with an HPGe detector, and thus net peak area ratio of these lines is related to depth distribution of this radionuclide. Analogously in XRF, ratios of Kα, K, and L lines of an element can provide us with information on depth distribution of this element in an analysed object.

Název v anglickém jazyce

Theoretical study of depth profiling with gamma- and x-ray spectrometry based on measurements of intensity ratios

Popis výsledku anglicky

The gamma- and x-ray spectrometry is a powerful tool for analysis of materials. Gamma spectrometry (GS) is used to identification and quantification of radionuclides, whereas the stimulated emission of x-ray radiation is applied to elemental analysis with an x-ray fluorescence method (XRF). Samples for laboratory GS and destructive XRF are usually homogenized before the analysis. However, the homogeneous composition is not ensured in the case of in-situ GS or non-destructive XRF. The principle of the proposed techniques lay in the different attenuation coefficients for at least two x-ray or gamma-ray lines of a certain element or radionuclide, respectively. If an analyte is present at some depth, its radiation has to penetrate through thick layer of the matrix, and the photon fluxes are significantly changed. For instance, 214Bi is a member of the uranium series and in present in soil or walls of building. Two gamma lines of this radionuclide can be detected with an HPGe detector, and thus net peak area ratio of these lines is related to depth distribution of this radionuclide. Analogously in XRF, ratios of Kα, K, and L lines of an element can provide us with information on depth distribution of this element in an analysed object.

Druh

O - Ostatní výsledky

CEP obor

AL - Umění, architektura, kulturní dědictví

OECD FORD obor

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Projekt

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Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů