The Calibration of a Conventional X-ray Fluorescence Analyzer for Depth Profiling
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F15%3A00235304" target="_blank" >RIV/68407700:21340/15:00235304 - isvavai.cz</a>
Výsledek na webu
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DOI - Digital Object Identifier
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Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
The Calibration of a Conventional X-ray Fluorescence Analyzer for Depth Profiling
Popis výsledku v původním jazyce
The X-ray fluorescence analysis (XRF) is established as a technique for the determination of depth distribution of elements. In certain applications, the confocal modality cannot be used, there is a possibility of the conventional XRF. These applicationsare mostly performed in the research of cultural heritage objects where portable device for analysis is demanded. The Ka/Kb or La/M X-ray lines ratios where used for obtaining calibration diagrams of different depth distributions of the elements. The principle of the proposed Ka/Kb technique lies in the different absorption coefficients for the Ka and Kb lines. If an element is present at some depth, its characteristic radiation has to penetrate through thick layer of the matrix, and the characteristicX-ray fluxes are significantly changed. The depth of the layer can be described by K?/K? ratio of an element; i.e. lower ratio indicates deeper position. The experimental part includes measurements of standards of several elements from t
Název v anglickém jazyce
The Calibration of a Conventional X-ray Fluorescence Analyzer for Depth Profiling
Popis výsledku anglicky
The X-ray fluorescence analysis (XRF) is established as a technique for the determination of depth distribution of elements. In certain applications, the confocal modality cannot be used, there is a possibility of the conventional XRF. These applicationsare mostly performed in the research of cultural heritage objects where portable device for analysis is demanded. The Ka/Kb or La/M X-ray lines ratios where used for obtaining calibration diagrams of different depth distributions of the elements. The principle of the proposed Ka/Kb technique lies in the different absorption coefficients for the Ka and Kb lines. If an element is present at some depth, its characteristic radiation has to penetrate through thick layer of the matrix, and the characteristicX-ray fluxes are significantly changed. The depth of the layer can be described by K?/K? ratio of an element; i.e. lower ratio indicates deeper position. The experimental part includes measurements of standards of several elements from t
Klasifikace
Druh
O - Ostatní výsledky
CEP obor
BG - Jaderná, atomová a molekulová fyzika, urychlovače
OECD FORD obor
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Návaznosti výsledku
Projekt
<a href="/cs/project/DF12P01OVV034" target="_blank" >DF12P01OVV034: Průzkum sbírkových předmětů z fondů NTM moderními fyzikálními a chemickými metodami s cílem zkvalitnit jejich restaurování a preventivní konzervaci.</a><br>
Návaznosti
S - Specificky vyzkum na vysokych skolach
Ostatní
Rok uplatnění
2015
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů