Depth Profiling of Paint Layers with a Conventional Handheld X-ray Fluorescence Analyser

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F17%3A00311686" target="_blank" >RIV/68407700:21340/17:00311686 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

Depth Profiling of Paint Layers with a Conventional Handheld X-ray Fluorescence Analyser

Popis výsledku v původním jazyce

Handheld X-ray fluorescence (XRF) analysers are nowadays very common tools in the research of cultural heritage objects in which non-destructive analysis is demanded. XRF analysis is then simple to perform and the data evaluation is managed by provided software. The prices of portable devices are usually also reachable. In our contribution we focused on the advanced evaluation of data obtained from the measurement performed with a conventional handheld XRF device (NITON XL3t GOLDD+). The investigated samples consisted of at least 2 different paint layers and our aim was to get approximate information on elements present in particular paint layers. We used the technique that is known as the Kα/Kβ technique and it is based on an evaluation of intensities of two X-ray lines of an element of interest. So it can be used with any conventional XRF measurement. We present calibration method and its application to the samples with different composition. We evaluate the effects of the analyte and matrix composition to the possible application and results uncertainty. Such calibration procedure of the XRF spectrometer includes measurements of standards of several elements from thin to thick layer. The homogeneous standards were covered by a set of materials with different atomic number (Z) and known thicknesses. The measured standards, as well as covering materials, were chosen with the respect to the application in historical paintings survey. It means, the elements present in measured standards are often found in pigments. After the calibration of the XRF device, the samples consisting of paint layers of different composition were analysed and the inorganic pigments were identified in individual layers. Also we estimate the influence of the portable device, which are less mechanically stable than laboratory devices. This research is linked to the past work with Kα/Kβ technique on laboratory XRF devices [1], so the comparison is also included.

Název v anglickém jazyce

Depth Profiling of Paint Layers with a Conventional Handheld X-ray Fluorescence Analyser

Popis výsledku anglicky

Handheld X-ray fluorescence (XRF) analysers are nowadays very common tools in the research of cultural heritage objects in which non-destructive analysis is demanded. XRF analysis is then simple to perform and the data evaluation is managed by provided software. The prices of portable devices are usually also reachable. In our contribution we focused on the advanced evaluation of data obtained from the measurement performed with a conventional handheld XRF device (NITON XL3t GOLDD+). The investigated samples consisted of at least 2 different paint layers and our aim was to get approximate information on elements present in particular paint layers. We used the technique that is known as the Kα/Kβ technique and it is based on an evaluation of intensities of two X-ray lines of an element of interest. So it can be used with any conventional XRF measurement. We present calibration method and its application to the samples with different composition. We evaluate the effects of the analyte and matrix composition to the possible application and results uncertainty. Such calibration procedure of the XRF spectrometer includes measurements of standards of several elements from thin to thick layer. The homogeneous standards were covered by a set of materials with different atomic number (Z) and known thicknesses. The measured standards, as well as covering materials, were chosen with the respect to the application in historical paintings survey. It means, the elements present in measured standards are often found in pigments. After the calibration of the XRF device, the samples consisting of paint layers of different composition were analysed and the inorganic pigments were identified in individual layers. Also we estimate the influence of the portable device, which are less mechanically stable than laboratory devices. This research is linked to the past work with Kα/Kβ technique on laboratory XRF devices [1], so the comparison is also included.

Druh

O - Ostatní výsledky

CEP obor

—

OECD FORD obor

10304 - Nuclear physics

Projekt

<a href="/cs/project/DF13P01OVV010" target="_blank" >DF13P01OVV010: Historické technologie a moderní metody průzkumu. Interpretační možnosti specializovaných metod průzkumu děl středověkého umění s využitím inovativních technologií.</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů