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Determination of X-ray tubes radiation beam characteristics with semiconduictor pixel detectors

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F20%3A00339770" target="_blank" >RIV/68407700:21340/20:00339770 - isvavai.cz</a>

  • Výsledek na webu

    <a href="https://doi.org/10.1016/j.radphyschem.2020.108771" target="_blank" >https://doi.org/10.1016/j.radphyschem.2020.108771</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.radphyschem.2020.108771" target="_blank" >10.1016/j.radphyschem.2020.108771</a>

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Determination of X-ray tubes radiation beam characteristics with semiconduictor pixel detectors

  • Popis výsledku v původním jazyce

    X-ray tubes belong among the most important sources of ionizing radiation and are used in various applications and methods, i.e. investigation of materials, diagnostics in medicine, irradiations, etc. The exact properties of X-ray sources or their X-ray beams need to be known also when Monte Carlo simulations of experimental setups are considered with the aim of optimization or calibration of X-ray systems. These properties are X-ray spectra, beam profiles, divergence and homogeneity of beams. Properties of low power X-ray tubes with the maximum voltage up to 50 kV were investigated in this study. These devices included a small laboratory X-ray tube with collimated X-ray beam and microfocus X-ray tube with polycapillary focusing optics. Beam shape features were reconstructed from a silicon pixel detector response. The pixel detector was inserted into X-ray beams at different distances from X-ray sources. Beam 2D profiles were obtained and since the pixel detector worked in a single event detection mode, approximate energy of individual photons could be measured besides the position of their detection. In this way, detailed information about the beam properties was obtained.

  • Název v anglickém jazyce

    Determination of X-ray tubes radiation beam characteristics with semiconduictor pixel detectors

  • Popis výsledku anglicky

    X-ray tubes belong among the most important sources of ionizing radiation and are used in various applications and methods, i.e. investigation of materials, diagnostics in medicine, irradiations, etc. The exact properties of X-ray sources or their X-ray beams need to be known also when Monte Carlo simulations of experimental setups are considered with the aim of optimization or calibration of X-ray systems. These properties are X-ray spectra, beam profiles, divergence and homogeneity of beams. Properties of low power X-ray tubes with the maximum voltage up to 50 kV were investigated in this study. These devices included a small laboratory X-ray tube with collimated X-ray beam and microfocus X-ray tube with polycapillary focusing optics. Beam shape features were reconstructed from a silicon pixel detector response. The pixel detector was inserted into X-ray beams at different distances from X-ray sources. Beam 2D profiles were obtained and since the pixel detector worked in a single event detection mode, approximate energy of individual photons could be measured besides the position of their detection. In this way, detailed information about the beam properties was obtained.

Klasifikace

  • Druh

    J<sub>imp</sub> - Článek v periodiku v databázi Web of Science

  • CEP obor

  • OECD FORD obor

    10301 - Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)

Návaznosti výsledku

  • Projekt

    <a href="/cs/project/EF16_019%2F0000778" target="_blank" >EF16_019/0000778: Centrum pokročilých aplikovaných přírodních věd</a><br>

  • Návaznosti

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Ostatní

  • Rok uplatnění

    2020

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název periodika

    Radiation Physics and Chemistry

  • ISSN

    0969-806X

  • e-ISSN

    1879-0895

  • Svazek periodika

    172

  • Číslo periodika v rámci svazku

    108771

  • Stát vydavatele periodika

    GB - Spojené království Velké Británie a Severního Irska

  • Počet stran výsledku

    8

  • Strana od-do

  • Kód UT WoS článku

    000541935100012

  • EID výsledku v databázi Scopus

    2-s2.0-85079527573