Determination of X-ray tubes radiation beam characteristics with semiconduictor pixel detectors
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F20%3A00339770" target="_blank" >RIV/68407700:21340/20:00339770 - isvavai.cz</a>
Výsledek na webu
<a href="https://doi.org/10.1016/j.radphyschem.2020.108771" target="_blank" >https://doi.org/10.1016/j.radphyschem.2020.108771</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.radphyschem.2020.108771" target="_blank" >10.1016/j.radphyschem.2020.108771</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Determination of X-ray tubes radiation beam characteristics with semiconduictor pixel detectors
Popis výsledku v původním jazyce
X-ray tubes belong among the most important sources of ionizing radiation and are used in various applications and methods, i.e. investigation of materials, diagnostics in medicine, irradiations, etc. The exact properties of X-ray sources or their X-ray beams need to be known also when Monte Carlo simulations of experimental setups are considered with the aim of optimization or calibration of X-ray systems. These properties are X-ray spectra, beam profiles, divergence and homogeneity of beams. Properties of low power X-ray tubes with the maximum voltage up to 50 kV were investigated in this study. These devices included a small laboratory X-ray tube with collimated X-ray beam and microfocus X-ray tube with polycapillary focusing optics. Beam shape features were reconstructed from a silicon pixel detector response. The pixel detector was inserted into X-ray beams at different distances from X-ray sources. Beam 2D profiles were obtained and since the pixel detector worked in a single event detection mode, approximate energy of individual photons could be measured besides the position of their detection. In this way, detailed information about the beam properties was obtained.
Název v anglickém jazyce
Determination of X-ray tubes radiation beam characteristics with semiconduictor pixel detectors
Popis výsledku anglicky
X-ray tubes belong among the most important sources of ionizing radiation and are used in various applications and methods, i.e. investigation of materials, diagnostics in medicine, irradiations, etc. The exact properties of X-ray sources or their X-ray beams need to be known also when Monte Carlo simulations of experimental setups are considered with the aim of optimization or calibration of X-ray systems. These properties are X-ray spectra, beam profiles, divergence and homogeneity of beams. Properties of low power X-ray tubes with the maximum voltage up to 50 kV were investigated in this study. These devices included a small laboratory X-ray tube with collimated X-ray beam and microfocus X-ray tube with polycapillary focusing optics. Beam shape features were reconstructed from a silicon pixel detector response. The pixel detector was inserted into X-ray beams at different distances from X-ray sources. Beam 2D profiles were obtained and since the pixel detector worked in a single event detection mode, approximate energy of individual photons could be measured besides the position of their detection. In this way, detailed information about the beam properties was obtained.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10301 - Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
Návaznosti výsledku
Projekt
<a href="/cs/project/EF16_019%2F0000778" target="_blank" >EF16_019/0000778: Centrum pokročilých aplikovaných přírodních věd</a><br>
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Ostatní
Rok uplatnění
2020
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Radiation Physics and Chemistry
ISSN
0969-806X
e-ISSN
1879-0895
Svazek periodika
172
Číslo periodika v rámci svazku
108771
Stát vydavatele periodika
GB - Spojené království Velké Británie a Severního Irska
Počet stran výsledku
8
Strana od-do
—
Kód UT WoS článku
000541935100012
EID výsledku v databázi Scopus
2-s2.0-85079527573