Semiconductor pixel detector with absorption grid as a tool for charge sharing studies and energy resolution improvement

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F11%3A00185320" target="_blank" >RIV/68407700:21670/11:00185320 - isvavai.cz</a>

Výsledek na webu

<a href="http://iopscience.iop.org/1748-0221/6/12/C12034/" target="_blank" >http://iopscience.iop.org/1748-0221/6/12/C12034/</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1748-0221/6/12/C12034" target="_blank" >10.1088/1748-0221/6/12/C12034</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Semiconductor pixel detector with absorption grid as a tool for charge sharing studies and energy resolution improvement

Popis výsledku v původním jazyce

A novel approach for characterization of semiconductor pixel detectors using X-rays is presented. A precise gold grid placed in front of the sensor chip segments the incoming X-ray beam into a matrix of precisely defined micro-beams irradiating all pixels in well-defined positions. Analysis of the resulting moiré pattern allows evaluation of the charge sharing effect and determination of its influence on the spectrometric properties of the detector. As opposed to currently used single micro-beam studiesrealized at synchrotron sources, the whole pixel matrix is investigated at once. This offers a great tool for the investigation of charge sharing phenomena and verification of theoretical models used to describe these detectors. Similarly, such an absorption grid can be used for masking the pixel borders thus suppressing the charge sharing effect. This approach significantly improves the spectrometric properties of the pixelated detector at the cost of lower detection efficiency.

Název v anglickém jazyce

Semiconductor pixel detector with absorption grid as a tool for charge sharing studies and energy resolution improvement

Popis výsledku anglicky

A novel approach for characterization of semiconductor pixel detectors using X-rays is presented. A precise gold grid placed in front of the sensor chip segments the incoming X-ray beam into a matrix of precisely defined micro-beams irradiating all pixels in well-defined positions. Analysis of the resulting moiré pattern allows evaluation of the charge sharing effect and determination of its influence on the spectrometric properties of the detector. As opposed to currently used single micro-beam studiesrealized at synchrotron sources, the whole pixel matrix is investigated at once. This offers a great tool for the investigation of charge sharing phenomena and verification of theoretical models used to describe these detectors. Similarly, such an absorption grid can be used for masking the pixel borders thus suppressing the charge sharing effect. This approach significantly improves the spectrometric properties of the pixelated detector at the cost of lower detection efficiency.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Instrumentation

ISSN

1748-0221

e-ISSN

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Svazek periodika

6

Číslo periodika v rámci svazku

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Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

10

Strana od-do

1-10

Kód UT WoS článku

000299536600034

EID výsledku v databázi Scopus

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