Vysoce orientovaný krystalický Er:YAG a Er:YAP tenké vrstvy připravené PLD a žíhaním

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21460%2F09%3A12154732" target="_blank" >RIV/68407700:21460/09:12154732 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68378271:_____/09:00328762

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Highly oriented crystalline Er:YAG and Er:YAP layers prepared by PLD and annealing

Popis výsledku v původním jazyce

High quality, thick, highly oriented crystalline thin films of Yttrium Aluminum Garnet (Y3Al5O12) and Yttrium Aluminum Perovskite (YAlO3) doped with Erbium were prepared by pulsed laser deposition. Samples were created in vacuum or oxygen environment. Depositions were arranged at room temperature, or at high substrate temperatures ranging from 800 to 1100 degrees C. Amorphous layers were annealed by laser, or in oven (argon flow, temperatures in range from 1200 to 1400 degrees C). Fused silica and sapphire (0 0 0 1) were used as substrates. Properties of films were characterized by X-ray diffraction, atomic force microscopy, and by photoluminescence measurement. Size of crystalline grains was in the range 116-773 nm. Thickness of layers was up to 17 mum. (C) 2008 Elsevier B. V. All rights reserved.

Název v anglickém jazyce

Highly oriented crystalline Er:YAG and Er:YAP layers prepared by PLD and annealing

Popis výsledku anglicky

High quality, thick, highly oriented crystalline thin films of Yttrium Aluminum Garnet (Y3Al5O12) and Yttrium Aluminum Perovskite (YAlO3) doped with Erbium were prepared by pulsed laser deposition. Samples were created in vacuum or oxygen environment. Depositions were arranged at room temperature, or at high substrate temperatures ranging from 800 to 1100 degrees C. Amorphous layers were annealed by laser, or in oven (argon flow, temperatures in range from 1200 to 1400 degrees C). Fused silica and sapphire (0 0 0 1) were used as substrates. Properties of films were characterized by X-ray diffraction, atomic force microscopy, and by photoluminescence measurement. Size of crystalline grains was in the range 116-773 nm. Thickness of layers was up to 17 mum. (C) 2008 Elsevier B. V. All rights reserved.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BH - Optika, masery a lasery

OECD FORD obor

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Projekt

<a href="/cs/project/GA202%2F06%2F0216" target="_blank" >GA202/06/0216: Studium plazmatu vznikajícího při hybridní modifikaci pulzní laserové depozice</a><br>

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2009

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Applied Surface Science

ISSN

0169-4332

e-ISSN

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Svazek periodika

255

Číslo periodika v rámci svazku

10

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

3

Strana od-do

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Kód UT WoS článku

000263865000042

EID výsledku v databázi Scopus

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