Improvement of DLC implant coating using hybrid laser technology and germanium dopation

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21460%2F18%3A00326347" target="_blank" >RIV/68407700:21460/18:00326347 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Improvement of DLC implant coating using hybrid laser technology and germanium dopation

Popis výsledku v původním jazyce

Diamond-like carbon layers doped with germanium are able to improve the biocompatibility of perspective biomedical applications, including implants covering. Advantages and present state of the art and experiences with Ge-DLC layers are summarized and discussed. The system of combination of two laser beams for coating of implants was developed. The system is able of fine-tuning of dopants concentration Deposition arrangement and deposition conditions using one pulsed laser ablation with KrF excimer lasers, and one target (germanium) is presented. We prepared 5 samples. The Ge layers were deposited on silicon substrate by pulsed laser deposition (PLD). The 5 samples surfaces were analysed by a mechanical profilometer (Alphastep IQ – KLATencor) and atomic force microscopy (AFM) (Solver NEXT –NT-MDT) combined with an optical microscope.

Název v anglickém jazyce

Improvement of DLC implant coating using hybrid laser technology and germanium dopation

Popis výsledku anglicky

Diamond-like carbon layers doped with germanium are able to improve the biocompatibility of perspective biomedical applications, including implants covering. Advantages and present state of the art and experiences with Ge-DLC layers are summarized and discussed. The system of combination of two laser beams for coating of implants was developed. The system is able of fine-tuning of dopants concentration Deposition arrangement and deposition conditions using one pulsed laser ablation with KrF excimer lasers, and one target (germanium) is presented. We prepared 5 samples. The Ge layers were deposited on silicon substrate by pulsed laser deposition (PLD). The 5 samples surfaces were analysed by a mechanical profilometer (Alphastep IQ – KLATencor) and atomic force microscopy (AFM) (Solver NEXT –NT-MDT) combined with an optical microscope.

Druh

O - Ostatní výsledky

CEP obor

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OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

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Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2018

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů